Ef3S: An evaluation framework for flash-based systems

S. Carlo, Salvatore Galfano, Marco Indaco, P. Prinetto
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引用次数: 1

Abstract

NAND Flash memories are gaining popularity in the development of electronic embedded systems for both consumer and mission-critical applications. NAND Flashes crucially influence computing systems development and performances. EF3S, a framework to easily assess NAND Flash based memory systems performances (reliability, throughput, power), is presented. The framework is based on a simulation engine and a running environment which enable developers to assess any application impact. Experimental results show functionality of the framework, analysing several performance-reliability tradeoffs of an illustrative system.
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Ef3S:基于闪存系统的评估框架
NAND闪存在电子嵌入式系统的开发中越来越受欢迎,用于消费者和关键任务应用。NAND闪存对计算系统的发展和性能有着至关重要的影响。EF3S是一个框架,可以很容易地评估基于NAND闪存的存储系统的性能(可靠性,吞吐量,功率)。该框架基于模拟引擎和运行环境,使开发人员能够评估任何应用程序的影响。实验结果表明了该框架的功能性,并分析了一个示例系统的几个性能可靠性权衡。
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