Improving the Effectiveness of XOR-based Decompressors through Horizontal/Vertical Move of Stimulus Fragments

N. Alawadhi, O. Sinanoglu
{"title":"Improving the Effectiveness of XOR-based Decompressors through Horizontal/Vertical Move of Stimulus Fragments","authors":"N. Alawadhi, O. Sinanoglu","doi":"10.1109/DFT.2009.9","DOIUrl":null,"url":null,"abstract":"While test stimulus compression helps reduce test time and data volume, and thus alleviates test costs, the delivery of certain test vectors may not be possible, leading to test quality degradation. Whether a test vector is encodable in the presence of a decompressor strongly hinges on the distribution of its care bits. Utilization of stimulus manipulation techniques improves test pattern encodability as the distribution of care bits can be judiciously controlled. The desired test vector is delivered by resolving the stimulus conflicts that would have otherwise lead to pattern unencodability. Stimulus manipulation in the form of horizontal move of stimulus fragments has been shown to improve fan-out decompressors. In this work, we propose manipulation techniques in the form of horizontal or vertical move of stimulus fragments in order to improve XOR-based decompressors. Improvement in test pattern encodability reflects into savings in test costs and/or increase in test quality. The hardware and algorithmic support for each solution are also elaborated on, demonstrating the practicality of the proposed manipulation techniques.","PeriodicalId":405651,"journal":{"name":"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-10-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFT.2009.9","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3

Abstract

While test stimulus compression helps reduce test time and data volume, and thus alleviates test costs, the delivery of certain test vectors may not be possible, leading to test quality degradation. Whether a test vector is encodable in the presence of a decompressor strongly hinges on the distribution of its care bits. Utilization of stimulus manipulation techniques improves test pattern encodability as the distribution of care bits can be judiciously controlled. The desired test vector is delivered by resolving the stimulus conflicts that would have otherwise lead to pattern unencodability. Stimulus manipulation in the form of horizontal move of stimulus fragments has been shown to improve fan-out decompressors. In this work, we propose manipulation techniques in the form of horizontal or vertical move of stimulus fragments in order to improve XOR-based decompressors. Improvement in test pattern encodability reflects into savings in test costs and/or increase in test quality. The hardware and algorithmic support for each solution are also elaborated on, demonstrating the practicality of the proposed manipulation techniques.
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通过刺激碎片的水平/垂直移动提高xor减压器的有效性
虽然测试刺激压缩有助于减少测试时间和数据量,从而降低测试成本,但某些测试向量的传递可能无法实现,从而导致测试质量下降。在解压缩器存在的情况下,测试向量是否可编码很大程度上取决于其关心位的分布。刺激操作技术的利用提高了测试模式的可编码性,因为护理位的分布可以被明智地控制。通过解决刺激冲突来交付所需的测试向量,否则将导致模式不可编码。以刺激碎片水平移动的形式进行刺激操作已被证明可以改善扇形减压器。在这项工作中,我们提出了水平或垂直移动刺激碎片的操作技术,以改善基于xor的减压器。测试模式可编码性的改进反映为测试成本的节省和/或测试质量的提高。对每种解决方案的硬件和算法支持也进行了详细阐述,证明了所提出的操作技术的实用性。
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