{"title":"Defect distribution mapping in quartz","authors":"P. Zecchini, H. Lipson","doi":"10.1109/FREQ.1989.68908","DOIUrl":null,"url":null,"abstract":"Infrared and 632.7 nm laser absorption measurements have been used to characterize changes in aluminum compensation for irradiated and air-swept cultured and natural quartz. These measurements demonstrated irradiation dose effects and the competition between Al-OH and Al-h (aluminum-hole) compensation mechanisms. The laser technique was also used to localize mechanical and growth defects. By combining the results of X- and Y-direction observations for a given XY plane, information on both bulk growth defects and surface imperfections from polishing and other mechanical operations was obtained. A complete map of defects was obtained from measurements made over a range of Z-positions. The effects of /sup 60/Co gamma irradiation, air sweeping, reirradiation and annealing on grown-in OH. Al-OH and Al-h has been shown.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 43rd Annual Symposium on Frequency Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FREQ.1989.68908","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
Infrared and 632.7 nm laser absorption measurements have been used to characterize changes in aluminum compensation for irradiated and air-swept cultured and natural quartz. These measurements demonstrated irradiation dose effects and the competition between Al-OH and Al-h (aluminum-hole) compensation mechanisms. The laser technique was also used to localize mechanical and growth defects. By combining the results of X- and Y-direction observations for a given XY plane, information on both bulk growth defects and surface imperfections from polishing and other mechanical operations was obtained. A complete map of defects was obtained from measurements made over a range of Z-positions. The effects of /sup 60/Co gamma irradiation, air sweeping, reirradiation and annealing on grown-in OH. Al-OH and Al-h has been shown.<>
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