Two applications of thin-film resonator (TFR) technology are presented. These designs are: a 1-GHz voltage-controlled oscillator (VCO) with a 0.5% tuning range, and a frequency-agile 1-GHz oscillator which provides discrete frequency shifts of 4 MHz. The basic TFR frequency-control structure is a stacked-crystal filter (SCF) synthesized using multiple layers of AlN for piezoelectric transduction sandwiched between Al electrodes. Filters can be synthesized with single-mode bandpass or multiple (over-moded) bandpass characteristics. Typical performance for a single-mode double-stacked filter, when used in a 1-GHz VCO, provides an insertion loss as low as 1.5 dB, a linear phase extending over a 20-MHz passband, and an open-loop Q=80. The VCO was designed using a large-signal perturbational S-parameter technique.<>
{"title":"Design and performance of voltage-controlled oscillators using TFR stacked-crystal filters","authors":"P.H. Thompson, S. Burns, G. R. Kline, R. Weber","doi":"10.1109/FREQ.1989.68836","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68836","url":null,"abstract":"Two applications of thin-film resonator (TFR) technology are presented. These designs are: a 1-GHz voltage-controlled oscillator (VCO) with a 0.5% tuning range, and a frequency-agile 1-GHz oscillator which provides discrete frequency shifts of 4 MHz. The basic TFR frequency-control structure is a stacked-crystal filter (SCF) synthesized using multiple layers of AlN for piezoelectric transduction sandwiched between Al electrodes. Filters can be synthesized with single-mode bandpass or multiple (over-moded) bandpass characteristics. Typical performance for a single-mode double-stacked filter, when used in a 1-GHz VCO, provides an insertion loss as low as 1.5 dB, a linear phase extending over a 20-MHz passband, and an open-loop Q=80. The VCO was designed using a large-signal perturbational S-parameter technique.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126778212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Calculations have previously been made for rotated y-cuts, including the regions where the quasi-extensional and quasi-shear thickness modes have zero temperature coefficients of frequency. This work extends the calculations to doubly rotated bulk-wave resonators, and computes the coupling factors for the three simple-thickness modes driven by thickness (TE) and lateral (LE) quasistatic electric fields as a function of the orientation angles phi and theta , and the direction of the applied lateral field psi . Because of the temperature coefficients of the piezoelectric coupling factors, the temperature coefficient of a resonator depend not only upon orientation, but also upon harmonic number and location of the resonator operating point on the immittance circle. These considerations are addressed.<>
{"title":"Lateral- and thickness-field coupling in lithium tetraborate","authors":"A. Ballato, J. Kosinski, M. Mizan, T. Lukaszek","doi":"10.1109/FREQ.1989.68917","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68917","url":null,"abstract":"Calculations have previously been made for rotated y-cuts, including the regions where the quasi-extensional and quasi-shear thickness modes have zero temperature coefficients of frequency. This work extends the calculations to doubly rotated bulk-wave resonators, and computes the coupling factors for the three simple-thickness modes driven by thickness (TE) and lateral (LE) quasistatic electric fields as a function of the orientation angles phi and theta , and the direction of the applied lateral field psi . Because of the temperature coefficients of the piezoelectric coupling factors, the temperature coefficient of a resonator depend not only upon orientation, but also upon harmonic number and location of the resonator operating point on the immittance circle. These considerations are addressed.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117060954","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The goal of the resonator development program discussed by the authors was to develop dual c-mode resonators which have: frequency vs. temperature (f vs. T) characteristics free of significant anomalies; the minimum possible f vs. T slopes for the temperature ranges of interest; high Q; and small hysteresis. Well-behaved dual c-mode SC-cut resonator designs have been successfully developed. Plano-convex resonators of the proper contour are shown to be well-behaved on both the third overtone, at 10 MHz, and on the fundamental mode over at least a -55 degrees C to +85 degrees C temperature range. Such resonators are shown to be suitable for microcomputer compensated crystal oscillators with a stability of a few parts in 10/sup 8/.<>
作者讨论的谐振器开发计划的目标是开发双c模谐振器，其具有:频率与温度(f vs. T)特性，无显著异常;在感兴趣的温度范围内，f相对于T的最小可能斜率;高品质因数;而且迟滞小。性能良好的双c模SC-cut谐振器设计已经成功开发。适当轮廓的平凸谐振器在10 MHz的第三次泛音和至少在-55℃至+85℃温度范围内的基模上表现良好。这种谐振器被证明适用于微机补偿的晶体振荡器，其稳定性在10/sup / /的几个部分。
{"title":"Resonators for the microcomputer compensated crystal oscillator","authors":"R. Filler, J. Vig","doi":"10.1109/FREQ.1989.68852","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68852","url":null,"abstract":"The goal of the resonator development program discussed by the authors was to develop dual c-mode resonators which have: frequency vs. temperature (f vs. T) characteristics free of significant anomalies; the minimum possible f vs. T slopes for the temperature ranges of interest; high Q; and small hysteresis. Well-behaved dual c-mode SC-cut resonator designs have been successfully developed. Plano-convex resonators of the proper contour are shown to be well-behaved on both the third overtone, at 10 MHz, and on the fundamental mode over at least a -55 degrees C to +85 degrees C temperature range. Such resonators are shown to be suitable for microcomputer compensated crystal oscillators with a stability of a few parts in 10/sup 8/.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125111193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The performance of a VHF crystal oscillator in the 100-MHz range is described under vibration and during acoustic noise excitation. The fifth-overtone resonator is supported on four massive posts and held in place by a precisely controlled support area of a compliant adhesive. Because the adhesive is an insulator, electrical connections between crystal and header pins are made via Au-bonded wires. The behavior of the short-term stability, composed of near-carrier phase noise and of spurious, flexure-induced resonances experienced under typical vibration and acoustic noise stresses, is reported. Phase noise measurements obtained at X-band after approximately=100* multiplication are described on a number of randomly selected SC and some At-cut crystals using the compliant mount. All results were obtained using the same foamed hybrid test oscillator excited with sinusoidal excitation of 2 g/sub rms/ at 1 KHz. These crystals routinely yielded a vibration sensitivity factor Gamma >
{"title":"The vibration-induced phase noise of a visco-elastically supported crystal resonator","authors":"R. D. Weglein","doi":"10.1109/FREQ.1989.68901","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68901","url":null,"abstract":"The performance of a VHF crystal oscillator in the 100-MHz range is described under vibration and during acoustic noise excitation. The fifth-overtone resonator is supported on four massive posts and held in place by a precisely controlled support area of a compliant adhesive. Because the adhesive is an insulator, electrical connections between crystal and header pins are made via Au-bonded wires. The behavior of the short-term stability, composed of near-carrier phase noise and of spurious, flexure-induced resonances experienced under typical vibration and acoustic noise stresses, is reported. Phase noise measurements obtained at X-band after approximately=100* multiplication are described on a number of randomly selected SC and some At-cut crystals using the compliant mount. All results were obtained using the same foamed hybrid test oscillator excited with sinusoidal excitation of 2 g/sub rms/ at 1 KHz. These crystals routinely yielded a vibration sensitivity factor Gamma <or=3*10/sup -10/.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114145296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A special clock test facility is described to evaluate atomic clocks developed for space and ground application. The facility itself is described and the methodologies involved in long-term performance testing, initial qualification testing of spacecraft clocks, and post-acceptance testing of candidate spaceflight clocks to be evaluated in orbit. The objective of long-term testing is to build a performance and reliability database on newly developed clocks to support eventual operational system acceptance. Initial qualification testing for developing clocks is used to guide development under contract and to support in-house design of components, subsystems and experimental atomic clocks. Typical testing procedures and methodologies are discussed.<>
{"title":"Test and evaluation methods at the NRL clock test facility","authors":"R. Beard, F. Danzy, E. Powers, J. White","doi":"10.1109/FREQ.1989.68878","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68878","url":null,"abstract":"A special clock test facility is described to evaluate atomic clocks developed for space and ground application. The facility itself is described and the methodologies involved in long-term performance testing, initial qualification testing of spacecraft clocks, and post-acceptance testing of candidate spaceflight clocks to be evaluated in orbit. The objective of long-term testing is to build a performance and reliability database on newly developed clocks to support eventual operational system acceptance. Initial qualification testing for developing clocks is used to guide development under contract and to support in-house design of components, subsystems and experimental atomic clocks. Typical testing procedures and methodologies are discussed.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124009174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A quartz crystal resonator that can be modeled as a one- or two-port electrical circuit is discussed. Extraction of the equivalent electrical parameters can be accomplished using scattering parameters measured near the resonant frequency of the crystal. Due to measurement errors inherent in the network analyzer, the extracted parameters will vary from run to run. These measurement inaccuracies lead to greater errors in the electrical parameters as the magnitude of S/sub 11/ (one-port model) or S/sub 12/ (two-port model) approaches one. This work presents results of measured and simulated data and a first-order sensitivity theory. An expression for the error in the extracted series resistance is derived. Simulated and actual crystal data are compared to the theoretical values for the one-port model.<>
{"title":"Quartz crystal resonator model measurement and sensitivity analysis","authors":"K. Park, D. Malocha, M. Belkerdid","doi":"10.1109/FREQ.1989.68892","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68892","url":null,"abstract":"A quartz crystal resonator that can be modeled as a one- or two-port electrical circuit is discussed. Extraction of the equivalent electrical parameters can be accomplished using scattering parameters measured near the resonant frequency of the crystal. Due to measurement errors inherent in the network analyzer, the extracted parameters will vary from run to run. These measurement inaccuracies lead to greater errors in the electrical parameters as the magnitude of S/sub 11/ (one-port model) or S/sub 12/ (two-port model) approaches one. This work presents results of measured and simulated data and a first-order sensitivity theory. An expression for the error in the extracted series resistance is derived. Simulated and actual crystal data are compared to the theoretical values for the one-port model.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"345 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114819390","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The parameters that directly influence the design of stable, coherent and pulsed VHF/UHF sources are identified. Assuming currently available commercial technology, an attempt is made to identify the optimum frequency, for maximum range, at which systems used for animal tracking should operate. The current state of the art of pulsed VHF/UHF transmitters, using quartz crystal resonators of minimum weight and volume is reviewed together with measurements on simple oscillator and frequency multiplier circuitry. Commercial chemically etched fundamental and overtone quartz crystal oscillators in the VHF frequency band have only recently become available; the performance of these units is compared with that available from low-ESR (effective series resistance) quartz crystal oscillators operating at third overtone in the 60-100-MHz region and with frequency multiplication factors of 3-8. Areas are identified where further research and development are required.<>
{"title":"Pulsed, coherent low power VHF/UHF transmitters-of minimal component count and weight","authors":"I. Dilworth","doi":"10.1109/FREQ.1989.68840","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68840","url":null,"abstract":"The parameters that directly influence the design of stable, coherent and pulsed VHF/UHF sources are identified. Assuming currently available commercial technology, an attempt is made to identify the optimum frequency, for maximum range, at which systems used for animal tracking should operate. The current state of the art of pulsed VHF/UHF transmitters, using quartz crystal resonators of minimum weight and volume is reviewed together with measurements on simple oscillator and frequency multiplier circuitry. Commercial chemically etched fundamental and overtone quartz crystal oscillators in the VHF frequency band have only recently become available; the performance of these units is compared with that available from low-ESR (effective series resistance) quartz crystal oscillators operating at third overtone in the 60-100-MHz region and with frequency multiplication factors of 3-8. Areas are identified where further research and development are required.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126232350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The test methods are described for measuring the environmental sensitivities of rubidium frequency standards. The work discusses the objectivity of such tests, the parameters to be considered and measured, the rationale for the test methods, the setups required to implement the tests, and the way that the test results are reported. It also considers environmental stress screening (ESS) of rubidium frequency standards. Examples of these tests are given.<>
{"title":"The testing of rubidium frequency standards","authors":"T. Lynch, W. Riley, J.R. Vaccaro","doi":"10.1109/FREQ.1989.68875","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68875","url":null,"abstract":"The test methods are described for measuring the environmental sensitivities of rubidium frequency standards. The work discusses the objectivity of such tests, the parameters to be considered and measured, the rationale for the test methods, the setups required to implement the tests, and the way that the test results are reported. It also considers environmental stress screening (ESS) of rubidium frequency standards. Examples of these tests are given.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"1538 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128060560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Two crystals of synthetic quartz were suitably prepared to study the effects of abrasion flaws and impurity content on the levels of stress required to induce Dauphine twinning. Four sample lots representing three surface treatments and two impurity levels were studied. One lot, designated as a control, was prepared from a crystal of low purity. Two lots prepared from the same crystal were abraded on one face with SiC grinding media, one with 15- mu particles and the other with 50- mu particles. Two stages of stress-induced Dauphine twinning are observed, namely nucleation and switchover. Raw data was collected in the form of applied load as read from a strip chart recorder attached to the stressing device. Contact areas of the specimens were determined and stress levels were calculated. These were ranked from lowest to highest and the standard form of the Weibull model was used to plot the data. A Newman-Keuls range test was used to estimate the significance of the difference between mean twinning stresses for all groups for nucleation and switchover. Initial results indicate that surface flaws and impurity concentration affect the stress level /required for twin nucleation and are factors in determining switchover stresses.<>
{"title":"Effects of surface abrasion and impurity levels on stress-induced Dauphine twinning in alpha quartz","authors":"D.A. Cocuzzi, J. Laughner","doi":"10.1109/FREQ.1989.68923","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68923","url":null,"abstract":"Two crystals of synthetic quartz were suitably prepared to study the effects of abrasion flaws and impurity content on the levels of stress required to induce Dauphine twinning. Four sample lots representing three surface treatments and two impurity levels were studied. One lot, designated as a control, was prepared from a crystal of low purity. Two lots prepared from the same crystal were abraded on one face with SiC grinding media, one with 15- mu particles and the other with 50- mu particles. Two stages of stress-induced Dauphine twinning are observed, namely nucleation and switchover. Raw data was collected in the form of applied load as read from a strip chart recorder attached to the stressing device. Contact areas of the specimens were determined and stress levels were calculated. These were ranked from lowest to highest and the standard form of the Weibull model was used to plot the data. A Newman-Keuls range test was used to estimate the significance of the difference between mean twinning stresses for all groups for nucleation and switchover. Initial results indicate that surface flaws and impurity concentration affect the stress level /required for twin nucleation and are factors in determining switchover stresses.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132856588","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Two-dimensional equations of motion of piezoelectric crystal plates, developed previously from the three-dimensional series of the thickness coordinate of the plate, are used to study the vibrations driven by the thickness electric field applied to the major surfaces of doubly-rotated quartz strips. Straight-crested vibrational solutions in closed form are obtained for the first eight coupled equations which constitute the two-dimensional, first-order approximate equations of motion of piezoelectric crystal plates. Dispersion curves, the frequency spectrum for electrically shorted and traction-free surface conditions, and mode shapes at different resonances and for various width-to-thickness ratios of the plate are computed and plotted for SC-cut quartz strips.<>
{"title":"Thickness-field excitation of doubly-rotated piezoelectric crystal","authors":"J. Hou, Pcy Lee","doi":"10.1109/FREQ.1989.68916","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68916","url":null,"abstract":"Two-dimensional equations of motion of piezoelectric crystal plates, developed previously from the three-dimensional series of the thickness coordinate of the plate, are used to study the vibrations driven by the thickness electric field applied to the major surfaces of doubly-rotated quartz strips. Straight-crested vibrational solutions in closed form are obtained for the first eight coupled equations which constitute the two-dimensional, first-order approximate equations of motion of piezoelectric crystal plates. Dispersion curves, the frequency spectrum for electrically shorted and traction-free surface conditions, and mode shapes at different resonances and for various width-to-thickness ratios of the plate are computed and plotted for SC-cut quartz strips.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"777 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117023844","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：