{"title":"A robust signum-based piecewise-linaer chaotic map and its application to microcontroller-based cost-effective random-bit generator","authors":"P. Ketthong, W. San-Um","doi":"10.1109/IEECON.2014.6925909","DOIUrl":null,"url":null,"abstract":"This paper presents anew random-bit generator. The random signal source is a new signum-based piecewise-linear chaotic map, which provides not only robust chaos against parameter changes but also symmetric bifurcation for zero-thresholding for digital random-bit generation. Chaos dynamics are described in terms of equilibrium and Jacobian analysis, bifurcation diagram, Lyapunov exponent, time-and frequency domain signal, and cobweb plots. Autocorrelation, histogram, and NIST standard tests suite have been realized for statistical analysis of randomness of binary sequence, and the sufficient length of 1,000,000 bits successfully passed all NIST standard tests. Experimental results of digital random-bit sequences on have been performed using Microcontroller. The proposed random-bit generator offers a potential alternative in compact and robust random bit sequence for applications in computer information security.","PeriodicalId":306512,"journal":{"name":"2014 International Electrical Engineering Congress (iEECON)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2014-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 International Electrical Engineering Congress (iEECON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IEECON.2014.6925909","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
This paper presents anew random-bit generator. The random signal source is a new signum-based piecewise-linear chaotic map, which provides not only robust chaos against parameter changes but also symmetric bifurcation for zero-thresholding for digital random-bit generation. Chaos dynamics are described in terms of equilibrium and Jacobian analysis, bifurcation diagram, Lyapunov exponent, time-and frequency domain signal, and cobweb plots. Autocorrelation, histogram, and NIST standard tests suite have been realized for statistical analysis of randomness of binary sequence, and the sufficient length of 1,000,000 bits successfully passed all NIST standard tests. Experimental results of digital random-bit sequences on have been performed using Microcontroller. The proposed random-bit generator offers a potential alternative in compact and robust random bit sequence for applications in computer information security.