{"title":"Automated Measurement of the Bit-Error Rate as a Function of Signal-to-Noise Ratio for Microwave Communications Systems","authors":"R. Kerczewski, Elaine S. Daugherty, I. Kramarchuk","doi":"10.1109/ARFTG.1987.323853","DOIUrl":null,"url":null,"abstract":"The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal-to-noise ratio (or Eb/No). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"107 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"29th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1987.323853","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal-to-noise ratio (or Eb/No). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.
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