Pub Date : 1987-06-12DOI: 10.1109/ARFTG.1987.323868
P. Bartley
Frequency domain S-parameters are the fundamental measurements made at microwave frequencies. It has been nearly impossible to make physical time domain measurements at microwave frequencies. This led to time domain response being calculated from the measured frequency domain data. Traditionally, impulse response and step response were calculated. For many devices, the real interest is in measuring how the device distorts the signal it is intended to process. A method for extending the time domain capabilities of modern network analyzers to examining the response of a device to a more realistic input signal has been presented. These techniques can work in conjunction with the ¿real time¿ features of these analyzers. Modulation conversions can also be examined due to the capability to calculate instantaneous phase and frequency.
{"title":"Arbitrary Time Domain Stimulus with S-parameter Network Analyzers","authors":"P. Bartley","doi":"10.1109/ARFTG.1987.323868","DOIUrl":"https://doi.org/10.1109/ARFTG.1987.323868","url":null,"abstract":"Frequency domain S-parameters are the fundamental measurements made at microwave frequencies. It has been nearly impossible to make physical time domain measurements at microwave frequencies. This led to time domain response being calculated from the measured frequency domain data. Traditionally, impulse response and step response were calculated. For many devices, the real interest is in measuring how the device distorts the signal it is intended to process. A method for extending the time domain capabilities of modern network analyzers to examining the response of a device to a more realistic input signal has been presented. These techniques can work in conjunction with the ¿real time¿ features of these analyzers. Modulation conversions can also be examined due to the capability to calculate instantaneous phase and frequency.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128106796","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1987-06-12DOI: 10.1109/ARFTG.1987.323862
C. Hoer
This paper attempts to answer a number of questions that arise when using one or more lengths of precision coaxial transmission line to calibrate a dual 6-port automatic network analyzer, questions such as: How important is the quality of the test port relative to that of the line? What type connectors should the line standards have? What are the advantages of using two lines instead of one line and a through connection when test port imperfections are considered? How many lines are optimum from a quality control point of view? What should the lengths be? The answers to these questions appear to be: ¿ The quality of the line is much more important than that of the test port. A perfect line will calibrate out most imperfections in the test port. An example is given where 75-¿ test ports are calibrated with 50-¿ lines, and then used to measure reflection coefficient relative to 50 ¿ with very little error. ¿ Greatest accuracy is achieved with line standards having male connectors. ¿ Two lines get rid of many test port imperfections that one line cannot. Three lines will show up a problem if one line is bad. Five lines will identify which line is bad. Five is probably optimum. ¿ There may not be an optimum for the actual lengths of a set of lines, but there does appear to be an optimum difference in the lengths.
{"title":"Some Questions and Answers Concerning Air Lines as Impedance Standards","authors":"C. Hoer","doi":"10.1109/ARFTG.1987.323862","DOIUrl":"https://doi.org/10.1109/ARFTG.1987.323862","url":null,"abstract":"This paper attempts to answer a number of questions that arise when using one or more lengths of precision coaxial transmission line to calibrate a dual 6-port automatic network analyzer, questions such as: How important is the quality of the test port relative to that of the line? What type connectors should the line standards have? What are the advantages of using two lines instead of one line and a through connection when test port imperfections are considered? How many lines are optimum from a quality control point of view? What should the lengths be? The answers to these questions appear to be: ¿ The quality of the line is much more important than that of the test port. A perfect line will calibrate out most imperfections in the test port. An example is given where 75-¿ test ports are calibrated with 50-¿ lines, and then used to measure reflection coefficient relative to 50 ¿ with very little error. ¿ Greatest accuracy is achieved with line standards having male connectors. ¿ Two lines get rid of many test port imperfections that one line cannot. Three lines will show up a problem if one line is bad. Five lines will identify which line is bad. Five is probably optimum. ¿ There may not be an optimum for the actual lengths of a set of lines, but there does appear to be an optimum difference in the lengths.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126531153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1987-06-01DOI: 10.1109/ARFTG.1987.323871
B. Herscher, R. Britton
Low-barrier Schottky diodes are attractive for use in automatic systems because their excellent speed of response allows measurements to be made very rapidly. In addition, with pulsed signals, measurements of the envelope are possible. Since noise measurements are required for many system and component evaluations, it is important to understand how power meters using diodes will perform when subjected to noisy signals. When operated over their entire useful dynamic range, diodes exhibit significant non-linearity. If noisy signals are measured out of the square-law region of operation the effects of the non-linearity must be taken into account. In this non-linear region the diode detector exhibits a different sensitivity to sinewave and broadband noise excitations. The useful dynamic range over which the accuracy of the noise measurement is maintained can be extended somewhat by correcting for this effect. However, at higher power levels it has been found that device dependent parasitics limit the accuracy with which diode detectors may be used for noise power measurements.
{"title":"Some Accuracy Considerations Applicable to the Automatic Measurement of Noise Using Schottky Barrier Detectors","authors":"B. Herscher, R. Britton","doi":"10.1109/ARFTG.1987.323871","DOIUrl":"https://doi.org/10.1109/ARFTG.1987.323871","url":null,"abstract":"Low-barrier Schottky diodes are attractive for use in automatic systems because their excellent speed of response allows measurements to be made very rapidly. In addition, with pulsed signals, measurements of the envelope are possible. Since noise measurements are required for many system and component evaluations, it is important to understand how power meters using diodes will perform when subjected to noisy signals. When operated over their entire useful dynamic range, diodes exhibit significant non-linearity. If noisy signals are measured out of the square-law region of operation the effects of the non-linearity must be taken into account. In this non-linear region the diode detector exhibits a different sensitivity to sinewave and broadband noise excitations. The useful dynamic range over which the accuracy of the noise measurement is maintained can be extended somewhat by correcting for this effect. However, at higher power levels it has been found that device dependent parasitics limit the accuracy with which diode detectors may be used for noise power measurements.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123721344","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1987-06-01DOI: 10.1109/ARFTG.1987.323872
G. Bright, R. Macior, H. Schuman
A method is presented for applying direct detection (no local oscilator) I/Q detectors (discriminators) to obtain accurate phase and gain measurements without continuously leveling the sampled signals. The method applies the phase discriminator error model described in an eariler paper ("Coherent I/Q Detector Performance Under Extended Drive Signal Conditions", 27th IEEE ARFTG, June, 1985) in such a way as to account for discriminator and system signal sampling channel phase and attenuation imbalance. The calibration results refer I & Q measurements directly to the device under test (DUT) input and output ports. The method accounts for discrimiator error as a function of device gain. The calibrated system is effective over 18 dB of dynamnic device gain with no phase ambiguity. Phase and gain accuracy is better than 1 degree and .1 dB respectively. For calibration reference, the system utilizes two standard step attenuators and a bi-phase modulator precalibrated on an Automatic Network Analyzer under continuous wave conditions. These devices provide known gain and phase conditions referenced to the DUT ports. The method and hardware yield a simple and cost effective way to generate accurate, repeatable pulsed RF phase and gain measurements.
{"title":"Application of Phase Discriminator Error Model to Pulsed RF Measurement System Calibration","authors":"G. Bright, R. Macior, H. Schuman","doi":"10.1109/ARFTG.1987.323872","DOIUrl":"https://doi.org/10.1109/ARFTG.1987.323872","url":null,"abstract":"A method is presented for applying direct detection (no local oscilator) I/Q detectors (discriminators) to obtain accurate phase and gain measurements without continuously leveling the sampled signals. The method applies the phase discriminator error model described in an eariler paper (\"Coherent I/Q Detector Performance Under Extended Drive Signal Conditions\", 27th IEEE ARFTG, June, 1985) in such a way as to account for discriminator and system signal sampling channel phase and attenuation imbalance. The calibration results refer I & Q measurements directly to the device under test (DUT) input and output ports. The method accounts for discrimiator error as a function of device gain. The calibrated system is effective over 18 dB of dynamnic device gain with no phase ambiguity. Phase and gain accuracy is better than 1 degree and .1 dB respectively. For calibration reference, the system utilizes two standard step attenuators and a bi-phase modulator precalibrated on an Automatic Network Analyzer under continuous wave conditions. These devices provide known gain and phase conditions referenced to the DUT ports. The method and hardware yield a simple and cost effective way to generate accurate, repeatable pulsed RF phase and gain measurements.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131607585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1987-06-01DOI: 10.1109/ARFTG.1987.323864
S. Weinreb, B. Bates, R. Harris
A device which produces a known, mechanically-variable impedance and is useful for noise parameter or power load-pull measurements is described. The device integrates a three-stub waveguide tuner, a waveguide-to-microstrip adapter, a DC bias tee, and a removable chip-carrier into one compact unit. The design features a high degree of tuner repeatability, electrical readout of stub length, ease of calibration due to an accurately analyzable tuner structure, and operation at cryogenic temperatures if desired. The calibration procedure and a prototype unit operating in the 18-26.5 GHz band are described along with sample transistor noise parameter measurements.
{"title":"Calibrated Tuner for Chip Characterization Above 18 GHz","authors":"S. Weinreb, B. Bates, R. Harris","doi":"10.1109/ARFTG.1987.323864","DOIUrl":"https://doi.org/10.1109/ARFTG.1987.323864","url":null,"abstract":"A device which produces a known, mechanically-variable impedance and is useful for noise parameter or power load-pull measurements is described. The device integrates a three-stub waveguide tuner, a waveguide-to-microstrip adapter, a DC bias tee, and a removable chip-carrier into one compact unit. The design features a high degree of tuner repeatability, electrical readout of stub length, ease of calibration due to an accurately analyzable tuner structure, and operation at cryogenic temperatures if desired. The calibration procedure and a prototype unit operating in the 18-26.5 GHz band are described along with sample transistor noise parameter measurements.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116333361","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1987-06-01DOI: 10.1109/ARFTG.1987.323857
G. Simpson, R. Pollard
A new broadband automated microwave tuner system has been developed which is used to characterize transistor impedance, noise figure, and power output. The repeatability, accuracy, and speed provide a major improvement over manually operated tuners, and the broad 1.8 to 18 GHz bandwidth, low loss, wide matching range, and ability to reset to 50 Ohms provide superior performance over previously reported automated tuners. A GPIB controller allows either manual or automated control of one or two tuners. User friendly application software on HP Series 200/300 or the IBM PC allows the tuner impedance to be measured and stored, so contours of constant power, gain, or noise figure can be quickly determined as a transistor is measured. This satisfies a major industry need for a cost-effective, broadband measurement system.
{"title":"Automated Microwave Tuner System Simplifies Transistor Characterization","authors":"G. Simpson, R. Pollard","doi":"10.1109/ARFTG.1987.323857","DOIUrl":"https://doi.org/10.1109/ARFTG.1987.323857","url":null,"abstract":"A new broadband automated microwave tuner system has been developed which is used to characterize transistor impedance, noise figure, and power output. The repeatability, accuracy, and speed provide a major improvement over manually operated tuners, and the broad 1.8 to 18 GHz bandwidth, low loss, wide matching range, and ability to reset to 50 Ohms provide superior performance over previously reported automated tuners. A GPIB controller allows either manual or automated control of one or two tuners. User friendly application software on HP Series 200/300 or the IBM PC allows the tuner impedance to be measured and stored, so contours of constant power, gain, or noise figure can be quickly determined as a transistor is measured. This satisfies a major industry need for a cost-effective, broadband measurement system.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115634972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1987-06-01DOI: 10.1109/ARFTG.1987.323869
H. Stinehelfer
This paper wi1l describe the use of implanting a theoretical reflection inside an experimental measurement to remove a junction capacitance. Time domain analysis will be used to examine what is happening inside the circuit using the frequency domain representation for the "Implant". The implant process is performed on a set of measurements to allow more detailed examination of the circuit. The theoretical circuit can be capacitive, inductive or an impedance change at a given location. This technique can allow the measured date to be experimentally changed. The procees is less expensive and faster than making physical tuning changes.
{"title":"Implantation Process for Removing a Reflection Inside a Circuit","authors":"H. Stinehelfer","doi":"10.1109/ARFTG.1987.323869","DOIUrl":"https://doi.org/10.1109/ARFTG.1987.323869","url":null,"abstract":"This paper wi1l describe the use of implanting a theoretical reflection inside an experimental measurement to remove a junction capacitance. Time domain analysis will be used to examine what is happening inside the circuit using the frequency domain representation for the \"Implant\". The implant process is performed on a set of measurements to allow more detailed examination of the circuit. The theoretical circuit can be capacitive, inductive or an impedance change at a given location. This technique can allow the measured date to be experimentally changed. The procees is less expensive and faster than making physical tuning changes.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114712349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1987-06-01DOI: 10.1109/ARFTG.1987.323851
J. Izadian
Development of two waveguide transistor test-fixtures for Ka and U-band is presented. The biasing network has been designed as an integral part of the test-fixture eliminating the need for external biasing networks. The transistors under test are mounted on quartz or alumina substrate of .100 × .100 × .010 inch with source ground connections provided by two plated-through-via-holes. Some suggestions for the improvement of the test-fixtures and measurement repeatability are given.
{"title":"Transistor Test-Fixture with Biasing for Millimeter-Wave Noise Measurement","authors":"J. Izadian","doi":"10.1109/ARFTG.1987.323851","DOIUrl":"https://doi.org/10.1109/ARFTG.1987.323851","url":null,"abstract":"Development of two waveguide transistor test-fixtures for Ka and U-band is presented. The biasing network has been designed as an integral part of the test-fixture eliminating the need for external biasing networks. The transistors under test are mounted on quartz or alumina substrate of .100 × .100 × .010 inch with source ground connections provided by two plated-through-via-holes. Some suggestions for the improvement of the test-fixtures and measurement repeatability are given.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125686188","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1987-06-01DOI: 10.1109/ARFTG.1987.323854
V. A. Hirsch, M. Brunsman, T. Miers
This paper describes an automated noise and gain parameter measurement system which operates to 26.5 GHz and incorporates test fixture de-embedding. A unique combination of hardware components, operating software and fundamentally proven measurement techniques have been integrated to form a test system capable of highly accurate and repeatable noise and gain measurements. De-embedded noise and gain parameters obtained using this system will be presented for an 0.3 micron gate GaAs FET.
{"title":"An Automated System for De-Embedded Measurements of Noise and Gain Parameters","authors":"V. A. Hirsch, M. Brunsman, T. Miers","doi":"10.1109/ARFTG.1987.323854","DOIUrl":"https://doi.org/10.1109/ARFTG.1987.323854","url":null,"abstract":"This paper describes an automated noise and gain parameter measurement system which operates to 26.5 GHz and incorporates test fixture de-embedding. A unique combination of hardware components, operating software and fundamentally proven measurement techniques have been integrated to form a test system capable of highly accurate and repeatable noise and gain measurements. De-embedded noise and gain parameters obtained using this system will be presented for an 0.3 micron gate GaAs FET.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122081886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1987-06-01DOI: 10.1109/ARFTG.1987.323858
Edward H. Daw
A new network analyzer with enhanced user features has been described. The source locking concept provides the high speed synthesized signal that leads to fast operation. A new sampler design utilizing the K Connector permits operation to 40 GHz which covers the important Ka band. A color display is incorporated with system flexibility to display a single trace or a display of as many as eight traces showing four S parameters simultaneously. Color has been used to provide easy to interpret output data as well as a user interface that makes it easy to use the full functional capability of the analyzer.
{"title":"A New Coaxial 40 GHz Vector Network Analyzer","authors":"Edward H. Daw","doi":"10.1109/ARFTG.1987.323858","DOIUrl":"https://doi.org/10.1109/ARFTG.1987.323858","url":null,"abstract":"A new network analyzer with enhanced user features has been described. The source locking concept provides the high speed synthesized signal that leads to fast operation. A new sampler design utilizing the K Connector permits operation to 40 GHz which covers the important Ka band. A color display is incorporated with system flexibility to display a single trace or a display of as many as eight traces showing four S parameters simultaneously. Color has been used to provide easy to interpret output data as well as a user interface that makes it easy to use the full functional capability of the analyzer.","PeriodicalId":287736,"journal":{"name":"29th ARFTG Conference Digest","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1987-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115620793","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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