{"title":"Evolution of N-V memories: Flash memory trends with PCRAM/FeRAM/ReRAM","authors":"B. Prince","doi":"10.1109/INTERNANO.2009.5335614","DOIUrl":null,"url":null,"abstract":"Anything that stores two states can be a memory. The challenge is to get: Required Properties and Reliability for intended application at a competitive cost.","PeriodicalId":376370,"journal":{"name":"2009 International School and Seminar on Modern Problems of Nanoelectronics, Micro- and Nanosystem Technologies","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International School and Seminar on Modern Problems of Nanoelectronics, Micro- and Nanosystem Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/INTERNANO.2009.5335614","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Anything that stores two states can be a memory. The challenge is to get: Required Properties and Reliability for intended application at a competitive cost.
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