Melting Effect of Hole-Injecting Layer on the Performance of Passive Matrix Organic Light-Emitting Displays

Youngkyoo Kim, D. Choi, Hwajeong Kim
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引用次数: 1

Abstract

Here we report improved operation stability of passive matrix organic light-emitting displays (PM-OLED) by melting a hole-injecting layer (HIL) that is the first organic layer contacting anode. The PM-OLED displays fabricated in this work are consisted of 128� 128 pixels in which each pixel has a dimension of 200μm� 200μm. The exact thermal tran- sition behaviour of hole-injecting material was first examined using a differential scanning calorimeter in order to decide the melting temperature for the HIL melting process (300 o C/3min). Results show that the display with the untreated (as- coated) HIL exhibited large leakage current which eventually resulted in damages (black cross-talk lines) to the display during operation. However, no cross-talk defect was observed for the PM-OLED display with the thermally treated (melted) HIL, which was supported by the absence of leakage current at reverse bias. Since the breakthrough works on organic light-emitting devices (OLED) based on either low-molecular-weight mate- rials (i.e., small molecules) (1) or polymers (2), OLED dis- plays are now in market even though their applications are limited to small size display for MP3 players, mobile phones, car front panel devices, shavers, etc (3, 4). This suc- cessful debut of OLED display into market can be mainly attributed to remarkable advances in organic semiconductor materials and process technology (3-5). However, these OLED displays do still suffer from their short lifetime though the thermal stability of organic materi- als themselves has been significantly improved when it comes to the test device measurement (4, 6, 7). In case of OLED displays made using small molecules, it has been re- ported that a progressive electrical short (PES) phenomenon is responsible for the degradation of display pixels during long time operation (8). This report claimed that the PES phenomenon is closely related to the formation of unstable defects in organic layers which eventually leads to cata- strophic degradation of whole layers in pixels. In this report the PES phenomenon could be healed by thermal treatment at temperatures below 100 o
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注入孔层熔化对无源基质有机发光显示器性能的影响
本文报道了通过熔化一层空穴注入层(HIL)来改善无源矩阵有机发光显示器(PM-OLED)的工作稳定性,HIL是第一个接触阳极的有机层。本研究制作的PM-OLED显示器由128 ~ 128像素组成,每个像素的尺寸为200μm ~ 200μm。为了确定HIL熔化过程的熔化温度(300℃/3min),首先使用差示扫描量热计检测了喷孔材料的确切热转变行为。结果表明,未经处理(即涂覆)HIL的显示器显示出较大的漏电流,最终导致显示器在运行过程中损坏(黑色串扰线)。然而,热处理(熔化)HIL的PM-OLED显示器没有观察到串扰缺陷,这是由于反向偏置时没有漏电流的支持。由于这一突破是在基于低分子量材料(即小分子)(1)或聚合物(2)的有机发光器件(OLED)上取得的,因此OLED显示器现在已经进入市场,尽管它们的应用仅限于MP3播放器、移动电话、汽车前面板设备、剃须刀等的小尺寸显示器(3)。4). OLED显示器如此成功地首次进入市场,主要归功于有机半导体材料和工艺技术的显著进步(3-5)。然而,尽管有机材料本身的热稳定性在测试设备测量中得到了显着改善,但这些OLED显示器仍然存在寿命短的问题(4,6,7)。有报道称,在长时间运行过程中,渐进电短路(PES)现象是导致显示像素退化的原因(8)。该报告声称,PES现象与有机层中不稳定缺陷的形成密切相关,该缺陷最终导致像素中整个层的数据退化。在本报告中,PES现象可以通过低于100℃的热处理来治愈
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