Thermal characterization of crystal ovens used in phase noise measurement system

F. Sthal, S. Galliou, P. Abbé, N. Franquet, X. Vacheret, P. Salzenstein, E. Rubiola, G. Cibiel
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引用次数: 8

Abstract

In this paper, the thermal stability characterization of crystal ovens used in a phase noise measurement system of ultra-low noise crystal resonators is proposed. This bench is dedicated to test 5 MHz and 10 MHz crystal devices packaged in HC40 enclosures. New double ovens have been designed to improve the ultimate noise floor of our carrier suppression bench. A brief description of the temperature environment and processing are given. In addition, experiments to measure the thermal stability of the oven control are given. These new crystal ovens present an Allan standard deviation of about 2-10-15 at 1 s in terms of relative frequency fluctuations
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相位噪声测量系统中晶体炉的热特性
本文提出了用于超低噪声晶体谐振器相位噪声测量系统的晶体炉的热稳定性表征。该工作台专门用于测试封装在HC40机箱中的5 MHz和10 MHz晶体器件。新的双烘箱已被设计,以提高我们的载波抑制台的最终噪声底限。简要介绍了温度环境和处理方法。此外,还对烘箱控制的热稳定性进行了测试。这些新的晶体炉在1秒的相对频率波动方面呈现出大约2-10-15的艾伦标准偏差
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