Y. Shibasaki, Koji Asami, A. Kuwana, K. Machida, Yuanyang Du, Akemi Hatta, K. Kubo, Haruo Kobayashi
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引用次数: 4
Abstract
This paper investigates multi-tone signals for short-time and high quality testing of analog circuit frequency response. First, we study three multi-tone signal generation algorithms for minimum crest factor using an arbitrary waveform generator, and show that they are comparable. Then we propose crest factor controlled multi-tone signal generation algorithms for effective testing of transmitters. These algorithms are verified with simulations.
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