Q. Liu, W. Shen, F. Wang, D. Boroyevich, V. Stefanovic, M. Arpilliere
{"title":"Experimental evaluation of IGBTs for characterizing and modeling conducted EMI emission in PWM inverters","authors":"Q. Liu, W. Shen, F. Wang, D. Boroyevich, V. Stefanovic, M. Arpilliere","doi":"10.1109/PESC.2003.1217751","DOIUrl":null,"url":null,"abstract":"As a step to achieve the objective of predicting electromagnetic interference (EMI) noise in IGBT PWM inverters, this paper proposes a new and practical EMI noise source modeling method. An equivalent Thevenin source in the frequency-domain, including the voltage source and source impedance, is employed to model the main EMI noise emission source - the IGBT switching. The modeling approach for both the differential mode (DM) and common mode (CM) noise source is studied. The methodology is verified experimentally using a simple, controlled testbed. The important issues on measurement repeatability and data processing are also investigated and discussed.","PeriodicalId":236199,"journal":{"name":"IEEE 34th Annual Conference on Power Electronics Specialist, 2003. PESC '03.","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"34","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 34th Annual Conference on Power Electronics Specialist, 2003. PESC '03.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PESC.2003.1217751","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 34
Abstract
As a step to achieve the objective of predicting electromagnetic interference (EMI) noise in IGBT PWM inverters, this paper proposes a new and practical EMI noise source modeling method. An equivalent Thevenin source in the frequency-domain, including the voltage source and source impedance, is employed to model the main EMI noise emission source - the IGBT switching. The modeling approach for both the differential mode (DM) and common mode (CM) noise source is studied. The methodology is verified experimentally using a simple, controlled testbed. The important issues on measurement repeatability and data processing are also investigated and discussed.
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