J. Gómez-Pedrero, Diego Rodríguez-Ibáñez, J. Alonso, Juan A. Quirgoa
{"title":"Design and development of a profilometer for the fast and accurate characterization of optical surfaces","authors":"J. Gómez-Pedrero, Diego Rodríguez-Ibáñez, J. Alonso, Juan A. Quirgoa","doi":"10.1117/12.2191058","DOIUrl":null,"url":null,"abstract":"With the advent of techniques devised for the mass production of optical components made with surfaces of arbitrary form (also known as free form surfaces) in the last years, a parallel development of measuring systems adapted for these new kind of surfaces constitutes a real necessity for the industry. Profilometry is one of the preferred methods for the assessment of the quality of a surface, and is widely employed in the optical fabrication industry for the quality control of its products. In this work, we present the design, development and assembly of a new profilometer with five axis of movement, specifically suited to the measurement of medium size (up to 150 mm of diameter) \"free-form\" optical surfaces with sub-micrometer accuracy and low measuring times. The apparatus is formed by three X, Y, Z linear motorized positioners plus and additional angular and a tilt positioner employed to locate accurately the surface to be measured and the probe which can be a mechanical or an optical one, being optical one a confocal sensor based on chromatic aberration. Both optical and mechanical probes guarantee an accuracy lower than the micrometer in the determination of the surface height, thus ensuring an accuracy in the surface curvatures of the order of 0.01 D or better. An original calibration procedure based on the measurement of a precision sphere has been developed in order to correct the perpendicularity error between the axes of the linear positioners. To reduce the measuring time of the profilometer, a custom electronics, based on an Arduino™ controller, have been designed and produced in order to synchronize the five motorized positioners and the optical and mechanical probes so that a medium size surface (around 10 cm of diameter) with a dynamic range in curvatures of around 10 D, can be measured in less than 300 seconds (using three axes) keeping the resolution in height and curvature in the figures mentioned above.","PeriodicalId":212434,"journal":{"name":"SPIE Optical Systems Design","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"SPIE Optical Systems Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2191058","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
With the advent of techniques devised for the mass production of optical components made with surfaces of arbitrary form (also known as free form surfaces) in the last years, a parallel development of measuring systems adapted for these new kind of surfaces constitutes a real necessity for the industry. Profilometry is one of the preferred methods for the assessment of the quality of a surface, and is widely employed in the optical fabrication industry for the quality control of its products. In this work, we present the design, development and assembly of a new profilometer with five axis of movement, specifically suited to the measurement of medium size (up to 150 mm of diameter) "free-form" optical surfaces with sub-micrometer accuracy and low measuring times. The apparatus is formed by three X, Y, Z linear motorized positioners plus and additional angular and a tilt positioner employed to locate accurately the surface to be measured and the probe which can be a mechanical or an optical one, being optical one a confocal sensor based on chromatic aberration. Both optical and mechanical probes guarantee an accuracy lower than the micrometer in the determination of the surface height, thus ensuring an accuracy in the surface curvatures of the order of 0.01 D or better. An original calibration procedure based on the measurement of a precision sphere has been developed in order to correct the perpendicularity error between the axes of the linear positioners. To reduce the measuring time of the profilometer, a custom electronics, based on an Arduino™ controller, have been designed and produced in order to synchronize the five motorized positioners and the optical and mechanical probes so that a medium size surface (around 10 cm of diameter) with a dynamic range in curvatures of around 10 D, can be measured in less than 300 seconds (using three axes) keeping the resolution in height and curvature in the figures mentioned above.
随着近年来为任意形状表面(也称为自由形状表面)制造的光学元件的大规模生产而设计的技术的出现,适用于这些新型表面的测量系统的平行发展构成了该行业的真正必要性。轮廓测量法是评估表面质量的首选方法之一,在光学制造行业中被广泛应用于产品的质量控制。在这项工作中,我们介绍了一种具有五轴运动的新型轮廓仪的设计,开发和组装,特别适合于测量中等尺寸(直径高达150毫米)。具有亚微米精度和低测量时间的“自由形状”光学表面。该装置由三个X, Y, Z直线电动定位器和附加的角度定位器和倾斜定位器组成,用于精确定位待测表面,探头可以是机械探头或光学探头,光学探头是基于色差的共聚焦传感器。光学和机械探头在确定表面高度时保证精度低于微米,从而确保表面曲率精度为0.01 D或更好。为了校正直线定位机轴线之间的垂直度误差,提出了一种基于精密球体测量的原始校准方法。为了减少轮廓仪的测量时间,基于Arduino™控制器的定制电子设备已经设计和生产,以便同步五个电动定位器和光学和机械探头,以便在不到300秒的时间内测量一个中等尺寸的表面(直径约10厘米),动态范围在10 D左右(使用三个轴),保持高度和曲率的分辨率在上面提到的数字。