Case study - using stil as test pattern language

International Test Conference, 2003. Proceedings. ITC 2003. Pub Date : 2003-09-30 DOI:10.1109/TEST.2003.1270913

Daniel Fan, Steve Roehling, Rusty Carruth

引用次数: 0

Abstract

This paper describes the implementation of a test pattern language using STIL [1], the IEEE Standard Test Interface Language (1450-1999), in a next generation, open architecture Automated Test Equipment (ATE) platform. The advantages of this approach in extensibility and easy interface with Electronic Design Automation (EDA) tools for the ATE user are presented. Some challenges of using STIL as a general purpose ATE test pattern language are also presented. The overall EDA and ATE strategy and pattern system architecture based upon STIL are discussed.

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案例研究——使用still作为测试模式语言

本文描述了使用STIL [1] (IEEE标准测试接口语言(1450-1999))在下一代开放架构自动化测试设备(ATE)平台上实现测试模式语言。该方法具有可扩展性和易于与电子设计自动化(EDA)工具对接的优点。本文还提出了使用STIL作为通用ATE测试模式语言的一些挑战。讨论了基于STIL的EDA和ATE总体策略和模式系统架构。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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International Test Conference, 2003. Proceedings. ITC 2003.

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