Real-time flat panel pixel imaging system in X-ray detection

Abstract

The aim of this study is to present our first results in industrial nondestructive testing obtained with a real-time digital imaging device, X-View, based on active matrix flat panel imager technology. X-View consists of X-ray converters, arrays of amorphous silicon (a-Si:H) thin film transistors (TFT) and photodiodes, a fast realtime electronic system for readout and digitization of images and appropriate computer tools for control, realtime image treatment data representation and off-line analysis. Different tests objects were used for qualitative analysis. X-View is capable of producing up to 10 frames per second and with a pixel size up to 100 /spl mu/m. Results show: easy handling of the device, its compactness and simplicity in operation; a wide dynamic range and lack of blooming; a high frame rate. The rapid image capture permits to install the system on a production site-the images are directly displayed on-line, on a PC monitor and archived in a digital form for radiography and radioscopy procedures. The flat panel X-ray imager based on amorphous silicon technology implemented in standard X-ray industrial equipment, permits acquisition of real-time images of excellent quality.