{"title":"Liquid cooling performance for a 3-dimensional multichip module and miniature heat sink","authors":"M. Vogel","doi":"10.1109/STHERM.1994.288991","DOIUrl":null,"url":null,"abstract":"Measured thermal performance is presented for a single phase liquid-cooled module. Tape automated bonded (TAB) thermal test chips and their associated substrates are stacked in a compact, 3-dimensional liquid tight module. A dielectric liquid, polyalphaolefin (PAO) is forced to flow past the active and inactive sides of the TAB chips. At a volumetric flowrate of 0.05 gallons per minute (gpm) and an estimated pressure loss less than 0.5 psi. the measured junction-to-liquid thermal resistance is 2.0 C/W for a 0.50\"/spl times/0.50\"/spl times/0.015\" thermal test chip. The thermal resistance was also measured for an indirect liquid cooling approach. PAO was used to cool a miniature sink mounted directly to a 0.50\"/spl times/0.50\" heat source. The heat source was used to simulate the thermal characteristics of a chip carrier package. Overall dimensions of the liquid heat sink measured 1.0\"/spl times/1.0\"/spl times/0.28\". The measured junction-to-liquid thermal resistance is 0.52 C/W for a flowrate of 0.05 gpm. and for an estimated pressure loss less than 1.0 psi. Numerical computational techniques yielded results which were comparable to the measured thermal resistances for both the 3-dimensional module and the miniature heat sink. Enhanced thermal performance gained by introducing micro encapsulated phase change material to the PAO is estimated for both the 3-dimensional module and the miniature heat sink.<<ETX>>","PeriodicalId":107140,"journal":{"name":"Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)","volume":"297 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1994 IEEE/CHMT 10th Semiconductor Thermal Measurement and Management Symposium (SEMI-THERM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/STHERM.1994.288991","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
Measured thermal performance is presented for a single phase liquid-cooled module. Tape automated bonded (TAB) thermal test chips and their associated substrates are stacked in a compact, 3-dimensional liquid tight module. A dielectric liquid, polyalphaolefin (PAO) is forced to flow past the active and inactive sides of the TAB chips. At a volumetric flowrate of 0.05 gallons per minute (gpm) and an estimated pressure loss less than 0.5 psi. the measured junction-to-liquid thermal resistance is 2.0 C/W for a 0.50"/spl times/0.50"/spl times/0.015" thermal test chip. The thermal resistance was also measured for an indirect liquid cooling approach. PAO was used to cool a miniature sink mounted directly to a 0.50"/spl times/0.50" heat source. The heat source was used to simulate the thermal characteristics of a chip carrier package. Overall dimensions of the liquid heat sink measured 1.0"/spl times/1.0"/spl times/0.28". The measured junction-to-liquid thermal resistance is 0.52 C/W for a flowrate of 0.05 gpm. and for an estimated pressure loss less than 1.0 psi. Numerical computational techniques yielded results which were comparable to the measured thermal resistances for both the 3-dimensional module and the miniature heat sink. Enhanced thermal performance gained by introducing micro encapsulated phase change material to the PAO is estimated for both the 3-dimensional module and the miniature heat sink.<>