A. Fali, Samuel T. White, T. Folland, N. A. Aghamiri, J. Caldwell, R. Haglund, Y. Abate
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引用次数: 0
Abstract
We employ nano-scale imaging and spectroscopy techniques to elucidate polariton characteristics as a function of the complex refractive index of the substrate. Although higher-order polariton modes exhibit wavelengths weakly sensitive to the environment, the principal mode strongly depends on the substrate dielectric constant.
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