Silver alloy wire bonding and optimization using robust development approach

Shei Meng Loo, R. Zhang, Geok Koon Orr, E. De Jesus, Raquel Fundan, L. Renard, J. Luan
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引用次数: 2

Abstract

Copper wire and palladium coated copper wires used for interconnections, widely in mass production today. Many forecasts are showing an accelerating trend that the market is moving more into copper wire business due to cost. Though copper wire technology maturity has increased more and more over these past decades, there are still a few limitations, intrinsic to the material itself, which leads to possible bonding process issues. Copper wire hardness is the current limitation for Front End technologies with delicate pad metal technology [1]; it can be very difficult to define a process window with zero defects. Silver wire, on the other hand, is striking the middle lane between hardness and bondability, making it a suitable candidate for the copper non-convertible products [2]. In this study, Ag alloy wire is proposed as an alternative to and Cu wire to lower down packaging cost without compromising on quality. The methodology applied to develop and validate the wire bonding process window is meeting the highest automotive standards and has passed AEC Q100 grade 1 reliability. Highlights have been put on how to optimize wire bonding workability and reliability of using Ag alloy wire in a QFP package. Design of Experiment is discussed and optimization to eliminate defects during reliability test to meet automotive requirements. An alternative to check the intermetallics coverage is also discussed. Furthermore, reliability results over four different pad metal technologies will be shared and discussed. Lastly, additional experiments are also done to check the effects of sulfurized wire during staging and ball formation due to poor forming gas, which usually affect copper wire reliability results.
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银合金焊丝的键合和优化采用稳健的开发方法
用于互连的铜线和镀钯铜线,今天广泛用于批量生产。许多预测显示,由于成本原因,市场正在加速转向铜线业务。虽然铜线技术在过去的几十年里越来越成熟,但仍然存在一些材料本身固有的局限性,这导致了可能的粘合过程问题。铜线硬度是目前使用精密焊盘金属技术的前端技术的局限性[1];定义一个零缺陷的过程窗口是非常困难的。另一方面,银线在硬度和可粘合性之间处于中间位置,使其成为铜不可转换产品的合适人选[2]。在这项研究中,提出银合金线作为铜线的替代品,以降低包装成本而不影响质量。用于开发和验证线键合工艺窗口的方法符合最高汽车标准,并已通过AEC Q100 1级可靠性。重点介绍了如何优化在QFP封装中使用银合金线的焊合性和可靠性。对试验设计进行了讨论和优化,以消除可靠性试验中的缺陷,满足汽车的要求。本文还讨论了另一种检查金属间化合物覆盖范围的方法。此外,将分享和讨论四种不同垫片金属技术的可靠性结果。最后,还进行了额外的实验,以验证由于成形气体不良而导致的硫化线在分段和成球过程中的影响,这通常会影响铜线的可靠性结果。
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