F. Wu, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, K. Miyase, X. Wen, N. Ahmed
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引用次数: 11
Abstract
This study investigates the reasons why test power reduction through X-filling techniques works well for cycle-average power reduction but is not so efficient concerning instantaneous peak power reduction.
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