{"title":"Uncertainty Analysis of an Electric Field Mill Calibration System","authors":"E. Auden","doi":"10.51843/wsproceedings.2017.22","DOIUrl":null,"url":null,"abstract":"Abstract: We present the uncertainty analysis for an electric field mill calibration system used at the Sandia Primary Standards Laboratory. The uncertainty analysis incorporates contributions from DC voltage supplied by a high voltage amplifier; the distance between an electrically isolated charge plate and the ground plate of a stainless steel test structure; type A measurement uncertainty; and uncertainty associated with operator variation, including cable arrangement, electrical connections, and the angle at which the field mill is loaded into the test structure.","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"NCSL International Workshop & Symposium Conference Proceedings 2017","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.51843/wsproceedings.2017.22","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Abstract: We present the uncertainty analysis for an electric field mill calibration system used at the Sandia Primary Standards Laboratory. The uncertainty analysis incorporates contributions from DC voltage supplied by a high voltage amplifier; the distance between an electrically isolated charge plate and the ground plate of a stainless steel test structure; type A measurement uncertainty; and uncertainty associated with operator variation, including cable arrangement, electrical connections, and the angle at which the field mill is loaded into the test structure.