Detecting Functional Safety Violations in Online AI Accelerators

Shamik Kundu, K. Basu
{"title":"Detecting Functional Safety Violations in Online AI Accelerators","authors":"Shamik Kundu, K. Basu","doi":"10.1109/IOLTS56730.2022.9897702","DOIUrl":null,"url":null,"abstract":"With the ubiquitous deployment of Deep Neural Networks (DNNs) in low latency mission critical applications, there has been an extensive proliferation of custom-built AI inference accelerators at the edge. Drastic technology scaling in recent years has made these circuits highly vulnerable to faults due to various reasons like aging, latent defects, single event upsets, etc. Such faults are highly detrimental to the classification accuracy of the AI accelerator, leading to the critical Functional Safety (FuSa) violation, when used in mission-critical applications. In order to detect such violations in mission mode, we analyze the efficiency of a software-based self test scheme that employs functional test patterns, akin to instances in the application dataset. Such patterns are either selected from the dataset of the DNN, or generated from scratch utilizing the concept of Generative Adversarial Networks (GANs). When evaluated on state-of-the-art DNNs on multivariate exhaustive datasets, the GAN generated test patterns significantly improve FuSa violation detection coverage by up to 130.28%, compared to the selected test patterns, thereby accomplishing efficient testing of the AI accelerator, online, in mission mode.","PeriodicalId":274595,"journal":{"name":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IOLTS56730.2022.9897702","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

With the ubiquitous deployment of Deep Neural Networks (DNNs) in low latency mission critical applications, there has been an extensive proliferation of custom-built AI inference accelerators at the edge. Drastic technology scaling in recent years has made these circuits highly vulnerable to faults due to various reasons like aging, latent defects, single event upsets, etc. Such faults are highly detrimental to the classification accuracy of the AI accelerator, leading to the critical Functional Safety (FuSa) violation, when used in mission-critical applications. In order to detect such violations in mission mode, we analyze the efficiency of a software-based self test scheme that employs functional test patterns, akin to instances in the application dataset. Such patterns are either selected from the dataset of the DNN, or generated from scratch utilizing the concept of Generative Adversarial Networks (GANs). When evaluated on state-of-the-art DNNs on multivariate exhaustive datasets, the GAN generated test patterns significantly improve FuSa violation detection coverage by up to 130.28%, compared to the selected test patterns, thereby accomplishing efficient testing of the AI accelerator, online, in mission mode.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
在线AI加速器的功能安全违规检测
随着深度神经网络(dnn)在低延迟关键任务应用中的普遍部署,边缘定制的人工智能推理加速器已经广泛扩散。近年来,由于技术规模的急剧扩大,这些电路由于老化、潜在缺陷、单事件扰动等各种原因极易发生故障。这些故障对人工智能加速器的分类准确性非常不利,在关键任务应用中使用时,会导致严重的功能安全(FuSa)违规。为了在任务模式下检测此类违规,我们分析了基于软件的自检方案的效率,该方案采用功能测试模式,类似于应用程序数据集中的实例。这些模式要么是从DNN的数据集中选择的,要么是利用生成对抗网络(gan)的概念从头生成的。当在最先进的dnn上对多元详尽数据集进行评估时,GAN生成的测试模式与选择的测试模式相比,显著提高了FuSa违规检测覆盖率,最高可达130.28%,从而实现了AI加速器在任务模式下的在线高效测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Structural Test Generation for AI Accelerators using Neural Twins Radiation-induced Effects on DMA Data Transfer in Reconfigurable Devices Functional and Timing Implications of Transient Faults in Critical Systems All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage IOLTS 2022 Cover Page
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1