AC harmonics effects on small external power supplies (wall warts)

E. Savage, W. Radasky, M. Madrid
{"title":"AC harmonics effects on small external power supplies (wall warts)","authors":"E. Savage, W. Radasky, M. Madrid","doi":"10.1109/ISEMC.2014.6899030","DOIUrl":null,"url":null,"abstract":"This paper reports on tests performed to determine the response of common low voltage power supplies when their AC power feed is distorted by various types and levels of harmonic distortion. Such distortion could be a possible form of IEMI attack on a facility. It is found that switched mode power supplies are immune to such attacks, but rectifier type supplies are very susceptible, if the distortion is not symmetrical.","PeriodicalId":279929,"journal":{"name":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE International Symposium on Electromagnetic Compatibility (EMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2014.6899030","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

This paper reports on tests performed to determine the response of common low voltage power supplies when their AC power feed is distorted by various types and levels of harmonic distortion. Such distortion could be a possible form of IEMI attack on a facility. It is found that switched mode power supplies are immune to such attacks, but rectifier type supplies are very susceptible, if the distortion is not symmetrical.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
交流谐波对小型外部电源的影响(壁疣)
本文报道了当普通低压电源的交流电源受到各种类型和程度的谐波畸变时,其响应的试验。这种扭曲可能是对设施进行电磁干扰攻击的一种可能形式。研究发现,开关模式电源不受这种攻击,但整流型电源非常容易受到影响,如果畸变不对称。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Application of emission source microscopy technique to EMI source localization above 5 GHz Modeling of carbon nanotube-metal contact losses in electronic devices Integrated-circuit countermeasures against information leakage through EM radiation Over-the-air performance testing of a real 4G LTE base station in a reverberation chamber A common-mode active filter in a compact package for a switching mode power supply
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1