{"title":"Frequency and Time Domain Characterization of High-Speed Digital Circuit Interconnects in a Multilayer Printed Circuit Board","authors":"A. Agrawal","doi":"10.1109/ARFTG.1992.327006","DOIUrl":null,"url":null,"abstract":"The digital interconnects are characterized in frequency domain by measuring the scattering matrices using network analyser. These scattering matrices are used to find frequency dependent resistance, inductance, capacitance, and conductance of the coupled transmission lines. In time domain, the lossy transmission line parameters are used to simulate the transient response to analyse the skin-effect and dielectric loss effect on the signal propagation and cross-talk.","PeriodicalId":130939,"journal":{"name":"40th ARFTG Conference Digest","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"40th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.1992.327006","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The digital interconnects are characterized in frequency domain by measuring the scattering matrices using network analyser. These scattering matrices are used to find frequency dependent resistance, inductance, capacitance, and conductance of the coupled transmission lines. In time domain, the lossy transmission line parameters are used to simulate the transient response to analyse the skin-effect and dielectric loss effect on the signal propagation and cross-talk.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
