{"title":"Power semiconductor devices: design and manufacturing for improved field reliability (invited)","authors":"K. Shenai","doi":"10.1109/ICCDCS.2002.1004104","DOIUrl":null,"url":null,"abstract":"In the information age, power electronic systems need to demonstrate, \"nine 9's\" of field reliability. The current reliability performance of most power converters is at best is in the range of \"six 9's.\" A dramatic improvement in device robustness is needed to successfully address the emerging market demand. In this paper, we discuss a new \"top-down\" system-level approach to identify and correct excessive field failures in compact high-frequency computer and telecom power supplies. We outline approaches to design and manufacture robust power semiconductor switches that guarantee \"built-in\" field reliability.","PeriodicalId":416680,"journal":{"name":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the Fourth IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.02TH8611)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCDCS.2002.1004104","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In the information age, power electronic systems need to demonstrate, "nine 9's" of field reliability. The current reliability performance of most power converters is at best is in the range of "six 9's." A dramatic improvement in device robustness is needed to successfully address the emerging market demand. In this paper, we discuss a new "top-down" system-level approach to identify and correct excessive field failures in compact high-frequency computer and telecom power supplies. We outline approaches to design and manufacture robust power semiconductor switches that guarantee "built-in" field reliability.
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