{"title":"Parameter estimation in MRF line process models","authors":"S. Nadabar, Anil K. Jain","doi":"10.1109/CVPR.1992.223140","DOIUrl":null,"url":null,"abstract":"A scheme for the estimation of the Markov random field (MRF) line process parameters that uses geometric CAD models of the objects in the scene is presented. The models are used to generate synthetic images of the objects from random viewpoints. The edge maps computed from the synthesized images are used as training samples to estimate the line process parameters using a least squares method. It is shown that this parameter estimation method is useful for detecting edges in range as well as intensity images.<<ETX>>","PeriodicalId":325476,"journal":{"name":"Proceedings 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"17","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1992 IEEE Computer Society Conference on Computer Vision and Pattern Recognition","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CVPR.1992.223140","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 17
Abstract
A scheme for the estimation of the Markov random field (MRF) line process parameters that uses geometric CAD models of the objects in the scene is presented. The models are used to generate synthetic images of the objects from random viewpoints. The edge maps computed from the synthesized images are used as training samples to estimate the line process parameters using a least squares method. It is shown that this parameter estimation method is useful for detecting edges in range as well as intensity images.<>