Millimeter-Wave Metamaterial-Based Sensor for Inhomogeneity Detection and Parameter Control of Technological Substances

A. Skuridin, A. Yelizarov, A. Kukharenko
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引用次数: 1

Abstract

Modern level of technology development leads to higher requirements for parameters of devices. Deviations, inaccuracies and unwanted inhomogeneity can cause not only significant malfunction and errors, but a complete failure of the device. In this paper we propose to use a metamaterial-based frequency-selective surface for control of physical parameters of matter and for inhomogeneity detection. We used CST STUDIO SUITE 2015 to simulate the FSS and show that it can be used to accomplish the tasks stated.
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基于毫米波超材料的工艺物质不均匀性检测与参数控制传感器
现代技术的发展对设备的参数提出了更高的要求。偏差、不准确和不需要的不均匀性不仅会导致严重的故障和错误,而且会导致设备的完全故障。在本文中,我们建议使用基于超材料的频率选择表面来控制物质的物理参数和非均匀性检测。我们使用CST STUDIO SUITE 2015对FSS进行了仿真,并表明它可以用来完成所述的任务。
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