{"title":"A case study of emission microscopy for ESD protection devices","authors":"D. Nikolov","doi":"10.1109/ET50336.2020.9238336","DOIUrl":null,"url":null,"abstract":"The paper presents an investigation of a typical ESD protection device with a photon emission microscope. The photon emissions from a normal and failed p-n junction with tunnelling breakdown are compared. The failure is caused by the ESD event. The comparison provides root cause analysis of the ESD failure, recognition of the physical mechanism to enable further analysis of ESD failures in integrated circuits.","PeriodicalId":178356,"journal":{"name":"2020 XXIX International Scientific Conference Electronics (ET)","volume":"110 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 XXIX International Scientific Conference Electronics (ET)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ET50336.2020.9238336","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The paper presents an investigation of a typical ESD protection device with a photon emission microscope. The photon emissions from a normal and failed p-n junction with tunnelling breakdown are compared. The failure is caused by the ESD event. The comparison provides root cause analysis of the ESD failure, recognition of the physical mechanism to enable further analysis of ESD failures in integrated circuits.
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