Bridging the gap between design and testing of analog integrated circuits

E. Soenen, P. Vanpeteghem, H. Liu, S. Narayan, J. Cummings
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引用次数: 4

Abstract

It is noted that an important problem associated with analog and mixed analog/digital VLSI design has been the lack of a systematic approach to the design and testing of such integrated systems. The authors describe a computer environment that brings the different design aspects closely together. It has been used successfully to analyze the performance of high-speed flash analog/digital converters. Interaction among simulations, CAD (computer-aided design) tools, measurements, and testing is provided for in this approach.<>
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弥合模拟集成电路设计和测试之间的差距
值得注意的是,与模拟和混合模拟/数字VLSI设计相关的一个重要问题是缺乏系统的方法来设计和测试这种集成系统。作者描述了一个将不同设计方面紧密结合在一起的计算机环境。该方法已成功用于高速闪存模拟/数字转换器的性能分析。这种方法提供了仿真、CAD(计算机辅助设计)工具、测量和测试之间的交互
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