A new strategy of successive approximation for fast analog-to-digital converter (ADC) circuits is discussed. A 4-b converter of one-cycle conversion time is first described. The scheme is then modified for flash conversion. The use of a 4-b flash converter in multiplex mode is shown to result in an 8-b converter requiring half-cycle conversion time. The bit subrangeable flash ADC is presented as an attractive proposal. This scheme essentially requires only two major components per bit and uses n identical circuits in cascade for n-b conversion.<>
{"title":"New strategies for fast ADC circuits","authors":"A. Kelkar, A. Dighe","doi":"10.1109/IMTC.1990.66003","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66003","url":null,"abstract":"A new strategy of successive approximation for fast analog-to-digital converter (ADC) circuits is discussed. A 4-b converter of one-cycle conversion time is first described. The scheme is then modified for flash conversion. The use of a 4-b flash converter in multiplex mode is shown to result in an 8-b converter requiring half-cycle conversion time. The bit subrangeable flash ADC is presented as an attractive proposal. This scheme essentially requires only two major components per bit and uses n identical circuits in cascade for n-b conversion.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116927656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An electronic, microcontroller-based system for high-pressure measurement, using a novel fiber-optic sensor, is presented. Attention is given to the problem of how to deal with a nonmonotonic (sinelike) characteristic of the sensor as a function of input pressure. The concept of a multisensor system is discussed, and a three-sensor, microcontroller-based, 'on-a-card' version of the system is proposed. An example of the system implementation for the pressure range up to 100 MPa with 0.01-MPa resolution is described. It is concluded that this 'on-a-card' version of the electronic pressure measurement system seems to be a reasonable compromise, considering the integration level of the system and the needs of users in potential applications.<>
{"title":"An electronic high-pressure measuring system using a polarimetric fiber-optic sensor","authors":"A. Barwicz, W. Bock","doi":"10.1109/IMTC.1990.65960","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65960","url":null,"abstract":"An electronic, microcontroller-based system for high-pressure measurement, using a novel fiber-optic sensor, is presented. Attention is given to the problem of how to deal with a nonmonotonic (sinelike) characteristic of the sensor as a function of input pressure. The concept of a multisensor system is discussed, and a three-sensor, microcontroller-based, 'on-a-card' version of the system is proposed. An example of the system implementation for the pressure range up to 100 MPa with 0.01-MPa resolution is described. It is concluded that this 'on-a-card' version of the electronic pressure measurement system seems to be a reasonable compromise, considering the integration level of the system and the needs of users in potential applications.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127342687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The problem of the integration of sensors into a coherent system for robotic applications is addressed by presenting a standard robot control architecture, the NASA/NBS Standard Reference Model for Telerobot Control System Architecture (NASREM). NASREM has three hierarchies: a task decomposition hierarchy, a world modeling hierarchy, and a sensory processing hierarchy. Goals at each level of the task decomposition hierarchy are divided both spatially and temporally into simpler commands for the next lower level. This decomposition is repeated until, at the lowest level, the drive signals to the robot actuators are generated. In order to accomplish their goals, task decomposition modules must often use information stored in the world model, which always stores the best estimate of the state of the world. The sensory processing hierarchy must update the world model. The concepts of NASREM are presented with emphasis on the sensors required for advanced capabilities in robot control.<>
{"title":"Integrating sensors into a standard control architecture for robotic applications","authors":"R. Lumia","doi":"10.1109/IMTC.1990.65980","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65980","url":null,"abstract":"The problem of the integration of sensors into a coherent system for robotic applications is addressed by presenting a standard robot control architecture, the NASA/NBS Standard Reference Model for Telerobot Control System Architecture (NASREM). NASREM has three hierarchies: a task decomposition hierarchy, a world modeling hierarchy, and a sensory processing hierarchy. Goals at each level of the task decomposition hierarchy are divided both spatially and temporally into simpler commands for the next lower level. This decomposition is repeated until, at the lowest level, the drive signals to the robot actuators are generated. In order to accomplish their goals, task decomposition modules must often use information stored in the world model, which always stores the best estimate of the state of the world. The sensory processing hierarchy must update the world model. The concepts of NASREM are presented with emphasis on the sensors required for advanced capabilities in robot control.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121286797","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It is shown that a wealth of information can be gathered on a waveform recorder by conducting two general tests: the sine-fit test and the step response test. The sine-fit test includes the effects of noise, nonlinearities, and aperture uncertainty but does not measure amplitude flatness or phase linearity. Sine-wave data may also be used to obtain a code-bin histogram, differential nonlinearity, and amplitude as a function of frequency. The step response yields pulse parameters (e.g. transition duration, overshoot, and settling time). In addition the step response can be used to generate amplitude and phase versus frequency, amplitude flatness, and phase linearity. The frequency response of these parameters can be extended by acquiring the step response in equivalent time mode. It may be appropriate to supplement these tests with specialized tests (e.g. aperture uncertainty) which may be important to a particular measurement.<>
{"title":"Introduction to waveform recorder testing","authors":"T. Linnenbrink","doi":"10.1109/IMTC.1990.65999","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65999","url":null,"abstract":"It is shown that a wealth of information can be gathered on a waveform recorder by conducting two general tests: the sine-fit test and the step response test. The sine-fit test includes the effects of noise, nonlinearities, and aperture uncertainty but does not measure amplitude flatness or phase linearity. Sine-wave data may also be used to obtain a code-bin histogram, differential nonlinearity, and amplitude as a function of frequency. The step response yields pulse parameters (e.g. transition duration, overshoot, and settling time). In addition the step response can be used to generate amplitude and phase versus frequency, amplitude flatness, and phase linearity. The frequency response of these parameters can be extended by acquiring the step response in equivalent time mode. It may be appropriate to supplement these tests with specialized tests (e.g. aperture uncertainty) which may be important to a particular measurement.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"17 9","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131804429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors present a systematic approach to analog design-for-testability which uses behavioral models for fault simulation so that objective comparisons can be made between alternative test configurations. This technique of design-for-testability is shown to be especially well suited to an ASIC's (application-specific integrated circuits') environment because the models can be reused and combined to form a library. The fault models should improve with time as more data are collected for a given block. For this reason, a design/experimentation environment has been developed to provide feedback to the system designers. The normal models can also be used to decide what specifications a block will need to function properly in a given system. This is very useful in the design phase for determining how well blocks will fit together, or how much linearity or signal swing a given block will need to achieve a certain high-level system specification.<>
{"title":"Design for testability using behavioral models","authors":"G. Spalding, P. Vanpeteghem, T. Brooks","doi":"10.1109/IMTC.1990.65964","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65964","url":null,"abstract":"The authors present a systematic approach to analog design-for-testability which uses behavioral models for fault simulation so that objective comparisons can be made between alternative test configurations. This technique of design-for-testability is shown to be especially well suited to an ASIC's (application-specific integrated circuits') environment because the models can be reused and combined to form a library. The fault models should improve with time as more data are collected for a given block. For this reason, a design/experimentation environment has been developed to provide feedback to the system designers. The normal models can also be used to decide what specifications a block will need to function properly in a given system. This is very useful in the design phase for determining how well blocks will fit together, or how much linearity or signal swing a given block will need to achieve a certain high-level system specification.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"273 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133410074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A novel three-receiving-elements amplitude comparison monopulse direction finding (DF) technique is introduced. An appropriate second-order discriminant function is chosen for this technique. Then simulation is used to compare its accuracy with that of the two-receiving-elements DF technique. Different sources of error were taken into consideration, such as receiver noise, pattern errors, amplitude imbalance, and mechanical and quantization errors. It is concluded that the three-receiving-elements amplitude comparison monopulse system is always more accurate than the two-elements system, especially around the receiving array axis.<>
{"title":"Second order discriminant function for amplitude comparison monopulse","authors":"E.E. Agrama, O. Abdel-Alim, M. Ezz-El-Arab","doi":"10.1109/IMTC.1990.65991","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65991","url":null,"abstract":"A novel three-receiving-elements amplitude comparison monopulse direction finding (DF) technique is introduced. An appropriate second-order discriminant function is chosen for this technique. Then simulation is used to compare its accuracy with that of the two-receiving-elements DF technique. Different sources of error were taken into consideration, such as receiver noise, pattern errors, amplitude imbalance, and mechanical and quantization errors. It is concluded that the three-receiving-elements amplitude comparison monopulse system is always more accurate than the two-elements system, especially around the receiving array axis.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115648801","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An algorithmic stage for bipolar 1-b analog-to-digital (A/D) conversion using a unity-gain buffer is proposed. Cyclic and pipeline A/D converter architectures using this stage iteratively or in cascade are also described. Error analysis and SPICE simulations show that a conversion accuracy higher than 8 b and a conversion rate up to 10 Mb/s are attainable with presently available 3- mu m CMOS technologies. Videofrequency operation may also be possible with finer linewidths. The component requirement is minimal, and thus it is best suited for an analog interface in application-specific integrated circuits. A prototype converter built using discrete components has confirmed the principles of operation.<>
提出了一种利用单位增益缓冲器进行双极1-b模数(A/D)转换的算法阶段。循环和流水线A/D转换器架构使用这一阶段迭代或级联也进行了描述。误差分析和SPICE仿真表明，目前可用的3 μ m CMOS技术可实现高于8 b的转换精度和高达10 Mb/s的转换速率。视频操作也可以用更细的线宽。元件要求最小，因此它最适合于特定应用集成电路中的模拟接口。使用分立元件构建的原型转换器已经证实了其工作原理。
{"title":"An algorithmic analog-to-digital converter using unity-gain buffers","authors":"S. Ogawa, K. Watanabe","doi":"10.1109/IMTC.1990.66004","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66004","url":null,"abstract":"An algorithmic stage for bipolar 1-b analog-to-digital (A/D) conversion using a unity-gain buffer is proposed. Cyclic and pipeline A/D converter architectures using this stage iteratively or in cascade are also described. Error analysis and SPICE simulations show that a conversion accuracy higher than 8 b and a conversion rate up to 10 Mb/s are attainable with presently available 3- mu m CMOS technologies. Videofrequency operation may also be possible with finer linewidths. The component requirement is minimal, and thus it is best suited for an analog interface in application-specific integrated circuits. A prototype converter built using discrete components has confirmed the principles of operation.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129330743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The VXIbus specification defines a technically sound modular instrument standard addressing electrical, mechanical, electromagnetic compatibility (EMC)/power, and communication requirements for modules. The standard does not cover certain information that is critical to the instrument module designer. For this reason, it becomes necessary for a VXIbus instrument manufacturer to define an internal standard to supplement the VXIbus specification. The author describes Hewlett-Packard's instrument module design standard, which addresses instrument language, front panel design, and common interface hardware, and other supplemental HP standards.<>
{"title":"The VXIbus from an instrument designer's perspective","authors":"S. Narciso","doi":"10.1109/IMTC.1990.66018","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66018","url":null,"abstract":"The VXIbus specification defines a technically sound modular instrument standard addressing electrical, mechanical, electromagnetic compatibility (EMC)/power, and communication requirements for modules. The standard does not cover certain information that is critical to the instrument module designer. For this reason, it becomes necessary for a VXIbus instrument manufacturer to define an internal standard to supplement the VXIbus specification. The author describes Hewlett-Packard's instrument module design standard, which addresses instrument language, front panel design, and common interface hardware, and other supplemental HP standards.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130249418","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A capacitive torque sensor in which two angular displacement sensors are spaced a well-defined distance apart is proposed. The rotor of each of these capacitive displacement sensors is composed of an array of electrodes connected to sine waves with phase angles in the sequence -0 degrees -90 degrees -180 degrees -270 degrees . These voltages are capacitively coupled from the stator to the rotor. The stator is also equipped with a readout electrode. The phase angle of the sine wave on this readout electrode is proportional to the rotor-to-state electrode overlapping and thus is proportional to the angular position. The phase difference between the output signals of the two angular displacement transducers is a direct measure of the twist angle and thus of the torque in the axis. The sensor allows noncontact torque measurement on a 10-mm-diameter steel axis in the 0-100-N-m range, with a 1-N-m inaccuracy irrespective of the angular velocity of the axis.<>
{"title":"Non-contact capacitive torque sensing on a rotating conductive axis","authors":"R. Wolffenbuttel, J. Foerster","doi":"10.1109/IMTC.1990.65983","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65983","url":null,"abstract":"A capacitive torque sensor in which two angular displacement sensors are spaced a well-defined distance apart is proposed. The rotor of each of these capacitive displacement sensors is composed of an array of electrodes connected to sine waves with phase angles in the sequence -0 degrees -90 degrees -180 degrees -270 degrees . These voltages are capacitively coupled from the stator to the rotor. The stator is also equipped with a readout electrode. The phase angle of the sine wave on this readout electrode is proportional to the rotor-to-state electrode overlapping and thus is proportional to the angular position. The phase difference between the output signals of the two angular displacement transducers is a direct measure of the twist angle and thus of the torque in the axis. The sensor allows noncontact torque measurement on a 10-mm-diameter steel axis in the 0-100-N-m range, with a 1-N-m inaccuracy irrespective of the angular velocity of the axis.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130453656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A smart temperature measurement system that consists of a commercially available self-calibrating thermocouple connected to a data-acquisition system with a specially designed algorithm capable of automatically detecting the calibration temperature of the self-calibrating thermocouple was developed. The self-calibrating thermocouple has a high-purity, low-melting-point metal encapsulated near its thermojunction. The time-temperature record of the thermocouple forms a plateau at the phase transition temperature of the encapsulated metal, providing a single-point calibration. Since the plateau is usually not horizontal, a major effort of the work reported was to determine which point of the phase transition plateau is the actual phase transition temperature. A finite-difference computer simulation program was written to explain the thermodynamic behavior of the system. On the basis of a literature review and simulation analysis, a method was developed to recognize which point on the melting or freezing plateau curve is the actual phase transition temperature of the encapsulated metal. The known phase transition temperature is compared with the reported melting or freezing point of the encapsulated metal to determine the magnitude of error in the thermocouple output.<>
{"title":"Modeling a self-calibrating thermocouple for use in a smart temperature measurement system","authors":"F. Ruppel","doi":"10.1109/IMTC.1990.65972","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65972","url":null,"abstract":"A smart temperature measurement system that consists of a commercially available self-calibrating thermocouple connected to a data-acquisition system with a specially designed algorithm capable of automatically detecting the calibration temperature of the self-calibrating thermocouple was developed. The self-calibrating thermocouple has a high-purity, low-melting-point metal encapsulated near its thermojunction. The time-temperature record of the thermocouple forms a plateau at the phase transition temperature of the encapsulated metal, providing a single-point calibration. Since the plateau is usually not horizontal, a major effort of the work reported was to determine which point of the phase transition plateau is the actual phase transition temperature. A finite-difference computer simulation program was written to explain the thermodynamic behavior of the system. On the basis of a literature review and simulation analysis, a method was developed to recognize which point on the melting or freezing plateau curve is the actual phase transition temperature of the encapsulated metal. The known phase transition temperature is compared with the reported melting or freezing point of the encapsulated metal to determine the magnitude of error in the thermocouple output.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123041366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：