TAB-model for multilevel diagnosis and repair of HDL SoC

Abstract

This paper describes technology for diagnosis SoC HDL-models, based on transaction graph. Diagnosis method is focused on decreasing the time of fault detection and memory for storage of diagnosis matrix by means of forming ternary relations between test, monitor, and functional component. A method for analyzing the activation matrix to detect the faulty blocks with given depth and synthesis logic functions for subsequent embedded hardware fault diagnosis is given.