Study on Multiple-pins Function Failure Isolation Method

Abstract

With the integration increasing of IC chip, the function is also getting more and more complicated. A single IC chip can have many functions. Different functions of the output require different output pins, the number of output pins increases from a few to hundreds. For a single IC chip, if an internal block is abnormal, it may affect many output pins. Most of the time, it is hard to find the relationship between these pins. In this paper, forcing method would be applied to identify the major failure pin from many abnormal pins quickly. This method can reduce a lot of microprobe analysis work, reduce the failure analysis time and increase the success rate of IC chip failure analysis.