A Dynamic Modeling and Simulation Method of Built-in Test(BIT) Based on State-chart Diagram

Abstract

At present, the domestic test modeling and simulation work is mainly based on the multi-signal model. This method is not intuitive enough and lacks applications that can dynamically display the fault transfer relationship of the BIT system, the BIT operation logic, and the fault detection and isolation demonstration. To solve this problem, this paper proposes a BIT modeling and simulation method based on state-chart diagram, and develops related modeling software. First, the basic principles and simulation ideas of state-chart diagram are introduced. Then, the BIT modeling architecture based on the state-chart diagram is introduced, and the realization of the state-chart diagram of the static structure elements and the realization of the state-chart diagram of the dynamic process elements are explained in detail. Finally, a case verification was carried out. By using the self-developed BIT dynamic modeling and simulation software, the product model, fault model and BIT model of the case were constructed, and the predicted results of testability indicators were given, which proved the effectiveness of the method.