{"title":"Electro-magnetic robustness of integrated circuits: from statement to prediction","authors":"S. Bendhia, A. Boyer","doi":"10.1109/EMCCOMPO.2013.6735202","DOIUrl":null,"url":null,"abstract":"EMRIC project, a new research activity mixing integrated circuits electromagnetic compatibility (EMC) and integrated circuits (ICs) reliability, provides methods and guidelines to circuits and equipment designers to ensure EMC during lifetime of their applications. In order to improve the ICs electromagnetic robustness (EMR) this project studies the effect of ICs ageing on electromagnetic emission and immunity to radio frequency interferences, clarifies the link between IC degradations and related EMC drifts and develops prediction models and propose “time insensitive” EMC protection structures.","PeriodicalId":302757,"journal":{"name":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","volume":"1995 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCCOMPO.2013.6735202","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
EMRIC project, a new research activity mixing integrated circuits electromagnetic compatibility (EMC) and integrated circuits (ICs) reliability, provides methods and guidelines to circuits and equipment designers to ensure EMC during lifetime of their applications. In order to improve the ICs electromagnetic robustness (EMR) this project studies the effect of ICs ageing on electromagnetic emission and immunity to radio frequency interferences, clarifies the link between IC degradations and related EMC drifts and develops prediction models and propose “time insensitive” EMC protection structures.
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