A kernel-based approach for functional test program generation

Abstract

This paper proposes a kernel-based functional test program generation approach for microprocessor test and verification. The fundamental idea in this approach is to select high quality test programs before the simulation from a large number of biased random test programs. Unlike a direct test program generation approach, a selection approach demands much less domain knowledge and intervention from its user for achieving a similar coverage goal, making it more applicable for scenarios targeting on different coverage objectives. We will demonstrate the effectiveness and efficiency of such an approach through performing experiments on a MIPS processor design.