{"title":"BAT Framework Modeling of Gate First HKMG Si-Capped SiGe Channel MOSFETs","authors":"N. Parihar, Tarun Samadder, S. Mahapatra","doi":"10.1007/978-981-16-6120-4_8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":356407,"journal":{"name":"Recent Advances in PMOS Negative Bias Temperature Instability","volume":"90 8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Recent Advances in PMOS Negative Bias Temperature Instability","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-981-16-6120-4_8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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