On-site Performances Evaluation of Photovoltaic Panels Affected by Bypass Activated Diodes Detected with Thermal Cameras

Alexandru-Ionel Constantin, D. Marin, P. Anghelita, Ioan Tiberiu Şerban, C. Morari, Gabriela Iosif
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Abstract

The paper presents results related to photovoltaic (PV) panels performances evaluation on bypass activated diodes faults, detected by means of thermographic inspection using two thermal cameras, as part of a preventive maintenance process on 8 years old on-grid 12 kW peak power system roof top, installed at National Institute for Research and Development in Electrical Engineering ICPE-CA. The PV panels performance evaluation is based on comparison of the faulty PV panels that contains bypass activated diodes with healthy ones, using their Current-Voltage (I-V) and Power-Voltage (P-V) characteristics measured by means of the HT I-V 400 equipment.
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热像仪检测旁路激活二极管对光伏板现场性能的影响
本文介绍了与旁路激活二极管故障的光伏(PV)面板性能评估相关的结果,通过使用两台热像仪进行热成像检测,作为对安装在国家电气工程研究与发展研究所(ICPE-CA)的8年并网12kw峰值电力系统屋顶进行预防性维护过程的一部分。光伏板的性能评估是基于使用HT I-V 400设备测量的电流电压(I-V)和功率电压(P-V)特性,将含有旁路激活二极管的故障光伏板与健康光伏板进行比较。
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