{"title":"A test structure for characterization of CMOS APS","authors":"T. Elkhatib, S. Moussa, H. Ragaie, H. Haddara","doi":"10.1109/ICM.2003.238501","DOIUrl":null,"url":null,"abstract":"A test structure to characterize CMOS APS image sensor is presented. Individual photodiodes and pixels as well as an image sensor array of 64/spl times/64 active pixels with selectable linear or logarithmic operation modes are designed. A test chip includes these features in addition to on-chip timing and control digital circuits as well as correlated double sampling have been built on a 0.6 /spl mu/m CMOS process. The test methodology and preliminary simulation results are presented.","PeriodicalId":180690,"journal":{"name":"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 12th IEEE International Conference on Fuzzy Systems (Cat. No.03CH37442)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2003.238501","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A test structure to characterize CMOS APS image sensor is presented. Individual photodiodes and pixels as well as an image sensor array of 64/spl times/64 active pixels with selectable linear or logarithmic operation modes are designed. A test chip includes these features in addition to on-chip timing and control digital circuits as well as correlated double sampling have been built on a 0.6 /spl mu/m CMOS process. The test methodology and preliminary simulation results are presented.
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