Simulator for signals from semiconductor radiation sensors used in testing of radiation measurement apparatus

Abstract

This paper presents an application for simulation and generation of signals from semiconductor radiation detectors which can be used in testing and calibrating of the processing circuitry within radiation measurement apparatus. The proposed application acts as a virtual semiconductor radiation sensor, generating the specific pulse signals delivered by the sensor processing circuitry in case of a radiation probe at the input. Signals generated by the virtual radiation sensor can be used in developing and testing phases of the signal processing circuitry and algorithms in a safe mode, without the need of any radiation source to be present at the input. For better accuracy of developing process, the simulator of the semiconductor radiation sensor can work with both simulated signal patterns and real signals acquired previously from different radiation sources.