{"title":"Vision, Progress and Discussion: A Measurement Information Infrastructure","authors":"M. Kuster","doi":"10.51843/wsproceedings.2017.13","DOIUrl":null,"url":null,"abstract":"What if your organization’s measurement, analysis and management computing systems spoke a shared language with other world-wide measurement-related systems? How would that affect your business? How would it ease your compliance challenges for ISO/IEC 17025 and other quality and technical documents? Imagine a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information. Those standards comprise what we call a measurement information infrastructure, or MII. Imagine MII-aware software that would create and automatically exchange and use accreditation scopes, instrument specifications and test &calibration certificates. This open discussion panel session follows up on the \"Toward a Measurement Information Infrastructure\" NCSLI Metrologist column to highlight how you may participate in the real-world benefits such an MII will generate and the efforts underway to realize them. The session will also demonstrate some MII-aware software under development and provide panelists to answer questions and solicit input and discussion from the audience.","PeriodicalId":432978,"journal":{"name":"NCSL International Workshop & Symposium Conference Proceedings 2017","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"NCSL International Workshop & Symposium Conference Proceedings 2017","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.51843/wsproceedings.2017.13","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
What if your organization’s measurement, analysis and management computing systems spoke a shared language with other world-wide measurement-related systems? How would that affect your business? How would it ease your compliance challenges for ISO/IEC 17025 and other quality and technical documents? Imagine a set of normative standards that define data structures, taxonomies, service protocols and security for locating, communicating and sharing measurement information. Those standards comprise what we call a measurement information infrastructure, or MII. Imagine MII-aware software that would create and automatically exchange and use accreditation scopes, instrument specifications and test &calibration certificates. This open discussion panel session follows up on the "Toward a Measurement Information Infrastructure" NCSLI Metrologist column to highlight how you may participate in the real-world benefits such an MII will generate and the efforts underway to realize them. The session will also demonstrate some MII-aware software under development and provide panelists to answer questions and solicit input and discussion from the audience.