An Improved Technological Basis for Radiated Susceptibility and Emissions Specifications

Abstract

Near-field radiated interference scenarios as typified by boxto-box coupling within the confines of a system envelope cannot be treated by far-field concepts. Specification limits based upon to tal em itted power and minimum power required to produce interference are proposed, and the means to m eas­ ure these quantities are described. M any practical benefits are expected including elimination of am biguities, ability to in­ clude dem onstrable system losses in the specification, a “ de­ rating" procedure to reduce te s t time, and the ability to take advantage of computers and programm able te st equipment.