A fully integrated Phase-locked loop with leakage current compensation in 65-nm CMOS technology

Abstract

In this study, a fully integrated Phase-locked loop (PLL) that is applicable to Universal Flash Storage (UFS) systems is presented. The fully integrated PLL is realized using a MOS capacitor as an on-chip loop filter (LF). To compensate for leakage current in the LF, a leakage current compensation scheme is presented. With the leakage compensation scheme, the peak-to-peak jitter and rms jitter are 40ps and 7.62ps, respectively. The area of the LF was reduced by around a sixteenth part compared with a metal insulator metal (MIM) capacitor.