An improved MESFET model for prediction of intermodulation load-pull characterization

J. Pedro, J. Perez
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引用次数: 9

Abstract

The contribution of the cross terms to the prediction of GaAs MESFET intermodulation load-pull behaviour can be important, and a method is presented for the complete experimental characterization of the drain-source current nonlinearities. An accurate characterization of the nonlinear distortion caused by the Ids(Vgs,Vds) current in a MESFET does not allow the common approach of splitting this nonlinear equivalent circuit element in two-voltage dependent nonlinear current sources, Gm(Vgs) and Gds(Vds). By an improved laboratory characterization procedure, it was possible to show that the cross terms of the Ids(Vgs,Vds) Taylor series expansion can give an important contribution to the prediction of a MESFET's intermodulation load-pull behaviour.<>
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一种用于互调负载-拉特性预测的改进MESFET模型
交叉项对预测GaAs MESFET互调负载-拉行为的贡献可能是重要的,并且提出了一种完整的实验表征漏源电流非线性的方法。MESFET中由Ids(Vgs,Vds)电流引起的非线性失真的准确表征不允许将这种非线性等效电路元件拆分为两个电压相关的非线性电流源,Gm(Vgs)和Gds(Vds)。通过改进的实验室表征程序,可以证明Ids(Vgs,Vds)泰勒级数展开的交叉项可以对MESFET的互调负载-拉行为的预测做出重要贡献
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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