Differential Fault Injection on Microarchitectural Simulators

Manolis Kaliorakis, Sotiris Tselonis, Athanasios Chatzidimitriou, N. Foutris, D. Gizopoulos
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引用次数: 64

Abstract

Fault injection on micro architectural structures modeled in performance simulators is an effective method for the assessment of microprocessors reliability in early design stages. Compared to lower level fault injection approaches it is orders of magnitude faster and allows execution of large portions of workloads to study the effect of faults to the final program output. Moreover, for many important hardware components it delivers accurate reliability estimates compared to analytical methods which are fast but are known to significantly over-estimate a structure's vulnerability to faults. This paper investigates the effectiveness of micro architectural fault injection for x86 and ARM microprocessors in a differential way: by developing and comparing two fault injection frameworks on top of the most popular performance simulators, MARSS and Gem5. The injectors, called MaFIN and GeFIN (for MARSS-based and Gem5-based Fault Injector, respectively), are designed for accurate reliability studies and deliver several contributions among which: (a) reliability studies for a wide set of fault models on major hardware structures (for different sizes and organizations), (b) study on the reliability sensitivity of micro architecture structures for the same ISA (x86) implemented on two different simulators, (c) study on the reliability of workloads and micro architectures for the two most popular ISAs (ARM vs. x86). For the workloads of our experimental study we analyze the common trends observed in the CPU reliability assessments produced by the two injectors. Also, we explain the sources of difference when diverging reliability reports are provided by the tools. Both the common trends and the differences are attributed to fundamental implementations of the simulators and are supported by benchmarks runtime statistics. The insights of our analysis can guide the selection of the most appropriate tool for hardware reliability studies (and thus decision-making for protection mechanisms) on certain micro architectures for the popular x86 and ARM ISAs.
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微架构模拟器的差分故障注入
在性能模拟器中对微结构进行故障注入是微处理器设计早期可靠性评估的一种有效方法。与较低级别的故障注入方法相比,它的速度要快几个数量级,并且允许执行大部分工作负载来研究故障对最终程序输出的影响。此外,与分析方法相比,对于许多重要的硬件组件,它提供了准确的可靠性估计,而分析方法速度很快,但已知会严重高估结构对故障的脆弱性。本文通过在最流行的性能模拟器MARSS和Gem5上开发和比较两种故障注入框架,以不同的方式研究了x86和ARM微处理器的微架构故障注入的有效性。MaFIN和GeFIN(分别是基于mars的故障注入器和基于gem5的故障注入器)是为精确的可靠性研究而设计的,并提供了以下几个贡献:(a)对主要硬件结构(针对不同规模和组织)的一系列故障模型进行可靠性研究,(b)对在两个不同模拟器上实现的同一ISA (x86)的微架构结构的可靠性敏感性研究,(c)对两种最流行的ISA (ARM与x86)的工作负载和微架构的可靠性研究。对于我们实验研究的工作负载,我们分析了在两个注入器产生的CPU可靠性评估中观察到的共同趋势。此外,我们解释差异的来源时,发散可靠性报告提供的工具。共同趋势和差异都归因于模拟器的基本实现,并得到基准测试运行时统计数据的支持。我们分析的见解可以指导在流行的x86和ARM isa的某些微架构上选择最合适的工具进行硬件可靠性研究(从而制定保护机制)。
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