{"title":"Study of the Input RF noise of a THz superconductor-insulator-superconductor receiver","authors":"M. Yao, Dong Liu, Jie Hu, Jing Li, S. Shi","doi":"10.1109/APMC.2015.7413035","DOIUrl":null,"url":null,"abstract":"The receiver noise temperature of THz superconductor-insulator-superconductor (SIS) receivers is composed of several contributions, in which the input RF noise is usually not negligible. In this paper, we investigate the input RF noise (Trf) of a waveguide superconducting niobium nitride (NbN) SIS receiver operating at 0.5THz. In particular, the input RF noise is measured for two respective cases of a small beam aperture surrounded by an aluminum plate and a blackbody, which is located just in front of the 0.5THz NbN SIS receiver. Detailed measurement results will be presented.","PeriodicalId":269888,"journal":{"name":"2015 Asia-Pacific Microwave Conference (APMC)","volume":"100 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 Asia-Pacific Microwave Conference (APMC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APMC.2015.7413035","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The receiver noise temperature of THz superconductor-insulator-superconductor (SIS) receivers is composed of several contributions, in which the input RF noise is usually not negligible. In this paper, we investigate the input RF noise (Trf) of a waveguide superconducting niobium nitride (NbN) SIS receiver operating at 0.5THz. In particular, the input RF noise is measured for two respective cases of a small beam aperture surrounded by an aluminum plate and a blackbody, which is located just in front of the 0.5THz NbN SIS receiver. Detailed measurement results will be presented.
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