A. A. Lisenkov, A. Gryaznov, N. Potrakhov, D. K. Kostrin, V. A. Simon, A. A. Uhov
{"title":"Scientific and technical cooperation with the enterprises of electronic industry of Saint-Petersburg in the field of vacuum and plasma technologies","authors":"A. A. Lisenkov, A. Gryaznov, N. Potrakhov, D. K. Kostrin, V. A. Simon, A. A. Uhov","doi":"10.1109/IVFORUM.2017.8246057","DOIUrl":null,"url":null,"abstract":"The report examines joint projects of the department of electronic instruments and devices of SPbETU “LETI” with the enterprises of electronic industry of Saint-Petersburg in the field of vacuum and plasma technologies. Features of training specialists for the needs of these enterprises are shown. Existing problems of both cooperation and training and ways of their solution are examined.","PeriodicalId":381276,"journal":{"name":"2017 IEEE VI Forum Strategic Partnership of Universities and Enterprises of Hi-Tech Branches (Science. Education. Innovations) (SPUE)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE VI Forum Strategic Partnership of Universities and Enterprises of Hi-Tech Branches (Science. Education. Innovations) (SPUE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVFORUM.2017.8246057","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The report examines joint projects of the department of electronic instruments and devices of SPbETU “LETI” with the enterprises of electronic industry of Saint-Petersburg in the field of vacuum and plasma technologies. Features of training specialists for the needs of these enterprises are shown. Existing problems of both cooperation and training and ways of their solution are examined.