I/O Blocks Reliability for an SRAM-Based FPGA When Exposed to Ionizing Radiation

Abstract

In this paper we present a survey of radiation induced failures in the Input/Output blocks of an SRAM-based Field Programmable Gate Array (FPGA), using a ring oscillator-based measurement technique. This study has been done on Xilinx's KINTEX-7 FPGA, while exposed to ion and X-rays beams. Two types of failures have been identified, amplitude and duty cycle failures, and the cross-section values were estimated to be approximately 0.6 · 10⁻⁵cm²/device for the amplitude failures and 1.6 · 10⁻⁵cm²/device for the other ones.