BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell

Abstract

Ensuring the correct operation of modern VLSI circuits within safety-critical systems is essential since modern technology nodes are more susceptible to Early-Life Failures (ELFs) and radiation-induced Soft-Errors (SEs). Tackling both of these challenges leads to contradicting design requirements: Effective in-field ELF detection requires online-monitoring or periodic built-in self-testing with excellent cell-internal defect coverage. SE-hardened latch designs, however, are less testable because they are designed to mask cell-internal failures. We propose BiSTAHL, a new SE-hardened scan-cell design that is fully built-in self-testable for both production defects and ELFs.