Test Systems Control for the Electronics Industry

Abstract

Overcoming the parametric uncertainty of the test-signals parameters of the test systems is an urgent topic. The goal is to ensure the reliability, depth and reliability of the control of electronic equipment of the UHF range. The task is to find a universal method of overcoming the uncertainty of the amplitude and time parameters of test signals of the nano- and subnanosecond ranges. We solve the problem of constructing a model of self-adjusting and adaptive control subsystem that shows its behavior during adjustment and takes into account the variation in the apparatus time parameters. As the result we get the structure of a self-adjusting and adaptive control system and the data on its research. Conclusions show the possibility of using the proposed self-adjusting and adaptive automatic control system in test systems. If the static and dynamic characteristics of the equipment and the test signal time parameters are changed, the control system monitors these changes and modifies the parameters of the regulator, while maintaining the optimum setting according to the specified criterion.