Zhe Wang, B. Mandracchia, P. Ferraro, V. Ferraro, E. Di Maio, P. Maffettone, Wei-Chung Chen, E. Fried
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Abstract
The thickness of thin liquid films is of great interest to industrial processes and life science. Here we propose a holographic system for the evaluation of the 3D topography and thickness of evolving thin liquid film.
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