In-situ Phase Analysis of Large Inclusions By Combining Computed Tomography And Energy-selective X-ray Diffraction

Jiqing Cai, Huan Wang, Kun Wang, Ling Qin, P. Zhang
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Abstract

The accurate positions of large inclusions in bulk metal can be determined using a computed tomography system but phase information for these inclusions cannot be obtained by the computed tomography method. In-situ phase information for internal material could be non-destructively obtained by an energy-selective diffraction system; however, it is necessary to place the inclusion in the centre of the diffraction area to ensure that the obtained diffraction signal comes from the inclusion material rather than the base material, which is difficult without appropriate non-destructive testing methods. In-situ phase information for large inclusions in the bulk metal could, in principle, be obtained by combining computed tomography and energy-selective X-ray diffraction (ESXRD) in one instrument. In this research, an X-ray analysis device with this capability is built. The computed tomography system and the energy-selective diffraction system share the same tungsten target X-ray source, motion system and spatial coordinates. A simulated sample containing inclusions is fabricated with a diameter of 20 mm and a height of 20 mm. The base material of the simulated sample is aluminium and the inclusions are α-Al2 O3 ceramic spheres with diameters of 1.5 mm, 2.5 mm, 3.5 mm and 5 mm. The diffraction information of some inclusions embedded in the simulated sample is successfully obtained using the combination instrument and the factors affecting the diffraction signal of the inclusions are analysed.
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结合计算机断层扫描和能量选择x射线衍射的大型夹杂物原位物相分析
大块金属中大型夹杂物的精确位置可以用计算机断层扫描系统确定,但这些夹杂物的相信息不能用计算机断层扫描方法获得。利用能量选择衍射系统可以无损地获得内部材料的原位相位信息;但是,必须将夹杂物放置在衍射区域的中心,以确保获得的衍射信号来自夹杂物材料而不是基材,如果没有适当的无损检测方法,这是很难做到的。原则上,通过将计算机断层扫描和能量选择x射线衍射(ESXRD)结合在一台仪器上,可以获得大块金属中大型夹杂物的原位相信息。在这项研究中,建立了一个具有这种能力的x射线分析装置。计算机层析成像系统和能量选择衍射系统具有相同的钨靶x射线源、运动系统和空间坐标。制备了直径为20mm、高度为20mm的含夹杂物模拟样品。模拟样品的基材为铝,夹杂物为α- al2o3陶瓷球,直径分别为1.5 mm、2.5 mm、3.5 mm和5mm。利用该组合仪器成功获取了模拟样品中包裹体的衍射信息,并分析了包裹体衍射信号的影响因素。
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